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Appl. Phys. Lett. 84, 2172 (2004); http://dx.doi.org/10.1063/1.1689405 (3 pages)

Out-of-plane mosaic of single-wall carbon nanotube films

W. Zhou1, K. I. Winey1, J. E. Fischer1, T. V. Sreekumar2, S. Kumar2, and H. Kataura3

1Department of Materials Science and Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, Pennsylvania 19104
2School of Polymer, Textile and Fiber Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332
3Department of Physics, Tokyo Metropolitan University, Tokyo 192-0397, Japan

(Received 11 November 2003; accepted 27 January 2004)

For single-wall carbon nanotube (SWNT) films deposited from suspension onto filter membranes, or by drop casting or spin coating onto flat substrates, the tube axes lie preferentially in the film plane. Using x-ray scattering and a two-dimensional detector, we show that this out-of-plane mosaic spread can be easily and accurately quantified. It varies significantly with deposition conditions, and the aligning effects of deposition and external force in the film plane (e.g., magnetic field) are additive. Films from well-dispersed tubes show better alignment than from poor dispersions. The finite out-of-plane mosaic in C60SWNT films enables quantitative separation of one-dimensional diffraction (chains of C60 peas) from the 2D rope lattice diffraction. © 2004 American Institute of Physics.

© 2004 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 61.46.-w

    Structure of nanoscale materials

  • 68.55.-a

    Thin film structure and morphology

  • 81.07.De

    Nanotubes

  • 81.15.Lm

    Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)

  • 78.70.Ck

    X-ray scattering

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

For access to fully linked references, you need to log in.
    L. Jin, C. Bower, and O. Zhou, Appl. Phys. Lett. 73, 1197 (1998)APPLAB000073000009001197000001.

    W. Zhou, J. Vavro, C. Guthy, K. I. Winey, J. E. Fischer, L. M. Ericson, S. Ramesh, R. Saini, V. A. Davis, C. Kittrell, M. Pasquali, R. H. Hauge, and R. E. Smalley, J. Appl. Phys. 95, 649 (2004)JAPIAU000095000002000649000001.

    J. E. Fischer, W. Zhou, J. Vavro, M. C. Llaguno, C. Guthy, R. Haggenmueller, M. J. Casavant, D. E. Walters, and R. E. Smalley, J. Appl. Phys. 93, 2157 (2003)JAPIAU000093000004002157000001.

    N. Bendiab, R. Almairac, J.-L. Sauvajol, S. Rols, and E. Elkaim, J. Appl. Phys. 93, 1769 (2003)JAPIAU000093000003001769000001.

    B. W. Smith, R. M. Russo, S. B. Chikkannanavar, and D. E. Luzzi, J. Appl. Phys. 91, 9333 (2002)JAPIAU000091000011009333000001.


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