APL Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Applied Physics Letters / Volume 94 / Issue 11 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 94, 111111 (2009); http://dx.doi.org/10.1063/1.3097016 (3 pages)

Single photon emission from a site-controlled quantum dot-micropillar cavity system

C. Schneider, T. Heindel, A. Huggenberger, P. Weinmann, C. Kistner, M. Kamp, S. Reitzenstein, S. Höfling, and A. Forchel

Technische Physik, Universität Würzburg, Am Hubland D-97074 Würzburg, Germany

View MapView Map

(Received 8 December 2008; accepted 18 February 2009; published online 19 March 2009)

We demonstrate the deterministic integration of single site-controlled quantum dots (SCQDs) into micropillar cavities. Spatial resonance between single positioned QDs and GaAs/AlAs micropillar cavities was achieved using cross markers for precise SCQD-cavity alignment. Cavity effects are clearly reflected in an enhanced photoluminescence intensity when tuning SCQD emission lines through the fundamental cavity resonance. Single photon emission from a spatially and spectrally coupled SCQD-resonator system is confirmed by photon autocorrelation measurements yielding a g(2)(0) value of 0.12.

© 2009 American Institute of Physics

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

aluminium compounds, gallium arsenide, III-V semiconductors, microcavities, photoluminescence, semiconductor quantum dots

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3097016

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    C. Schneider, M. Strauss, T. Sunner, A. Huggenberger, D. Wiener, S. Reitzenstein, M. Kamp, S. Höfling, and A. Forchel, Appl. Phys. Lett. 92, 183101 (2008)APPLAB000092000018183101000001.

    P. Gallo, M. Felici, B. Dwir, K. A. Atlasov, K. F. Karlsson, A. Rudra, A. Mohan, G. Biasiol, L. Sorba, and E. Kapon, Appl. Phys. Lett. 92, 263101 (2008)APPLAB000092000026263101000001.

    J. M. Gerard, B. Sermage, B. Gayral, B. Legrand, E. Costard, and V. Thierry-Mieg, Phys. Rev. Lett. 81, 1110 (1998).

    H. Lohmeyer, J. Kalden, K. Sebald, C. Kruse, D. Hommel, and J. Gutowski, Appl. Phys. Lett. 92, 011116 (2008)APPLAB000092000001011116000001.

    A. Dousse, L. Lanco, J. Suffczynski, E. Semenova, A. Miard, A. Lemaitre, I. Sagnes, C. Roblin, J. Bloch, and P. Senellart, Phys. Rev. Lett. 101, 267404 (2008).

    L. Wang, A. Rastelli, and O. G. Schmidt, J. Appl. Phys. 100, 064313 (2006)JAPIAU000100000006064313000001.

    S. Reitzenstein, C. Hofmann, A. Gorbunov, M. Gorbunov, M. Strauß, S. H. Kwon, C. Schneider, A. Loffler, S. Hofling, M. Kamp, and A. Forchel, Appl. Phys. Lett. 90, 251109 (2007)APPLAB000090000025251109000001.

    P. Atkinson, S. Kiravittaya, M. Benyoucef, A. Rastelli, and O. G. Schmidt, Appl. Phys. Lett. 93, 101908 (2008)APPLAB000093000010101908000001.

    D. Press, S. Gotzinger, S. Reitzenstein, C. Hofmann, A. Loffler, M. Kamp, A. Forchel, and Y. Yamamoto, Phys. Rev. Lett. 98, 117402 (2007).


For access to citing articles, you need to log in.


Figures (4)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Single photon emission from a site-controlled quantum dot-micropillar cavity system
  2. On-chip Si/SiOx microtube refractometer
  3. Power generation and shunt damping performance of a single crystal lead magnesium niobate-lead zirconate titanate unimorph: Analysis and experiment
  4. Enhanced Zeeman splitting in Ga0.25In0.75As quantum point contacts
  5. Lateral length scales of latent image roughness as determined by off-specular neutron reflectivity
Go to AIP Home
Copyright © American Institute of Physics
close