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2 Apr 2012

Volume 100, Issue 14, Articles (14xxxx)

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Appl. Phys. Lett. 100, 144101 (2012); http://dx.doi.org/10.1063/1.3697983 (4 pages)

H. Xu (徐涵), Wei Yu (余玮), M. Y. Yu (郁明阳), A. Y. Wong (黄燿煇), Z. M. Sheng (盛政明), M. Murakami (村上匡且), and J. Zhang (张杰)
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1/f noise of Josephson-junction-embedded microwave resonators at single photon energies and millikelvin temperatures

K. W. Murch, S. J. Weber, E. M. Levenson-Falk, R. Vijay, and I. Siddiqi

Appl. Phys. Lett. 100, 142601 (2012); http://dx.doi.org/10.1063/1.3700964 (3 pages) | Cited 3 times

Online Publication Date: 4 April 2012

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We present measurements of 1/f frequency noise in both linear and Josephson-junction-embedded superconducting aluminum resonators in the low power, low temperature regime—typical operating conditions for superconducting qubits. The addition of the Josephson junction does not result in additional frequency noise, thereby placing an upper limit for fractional critical current fluctuations of 1×10−8 (1/math) at 1 Hz for sub-micron, shadow evaporated junctions. These values imply a minimum dephasing time for a superconducting qubit due to critical current noise of 40–1400  μs depending on qubit architecture. Occasionally, at temperatures above 50 mK, we observe the activation of individual fluctuators which increase the level of noise significantly and exhibit Lorentzian spectra.
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85.25.Cp Josephson devices
85.25.-j Superconducting devices
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