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9 Apr 2012

Volume 100, Issue 15, Articles (15xxxx)

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Appl. Phys. Lett. 100, 153701 (2012); http://dx.doi.org/10.1063/1.3700446 (3 pages)

Hsiao-lu D. Lee, Steffen J. Sahl, Matthew D. Lew, and W. E. Moerner
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Erratum: “Real time estimation of equivalent cantilever parameters in tapping mode atomic force microscopy” [Appl. Phys. Lett. 95, 083113 (2009)]

Pranav Agarwal and Murti V. Salapaka

Appl. Phys. Lett. 100, 159901 (2012); http://dx.doi.org/10.1063/1.3702795 (1 page)

Online Publication Date: 10 April 2012

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Abstract Unavailable
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99.10.Cd Errata
07.79.Lh Atomic force microscopes
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Erratum: “Green luminescent center in undoped zinc oxide films deposited on silicon substrates" [Appl. Phys. Lett. 79(7), 943 (2001)]

B. Lin, Z. Fu, and Y. Jia

Appl. Phys. Lett. 100, 159902 (2012); http://dx.doi.org/10.1063/1.3703515 (1 page)

Online Publication Date: 10 April 2012

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Abstract Unavailable
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99.10.Cd Errata
78.55.Et II-VI semiconductors
78.66.Hf II-VI semiconductors
68.55.ag Semiconductors
61.72.Cc Kinetics of defect formation and annealing
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