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Applied Physics Letters / Volume 100 / Issue 24 / SURFACES AND INTERFACES

Appl. Phys. Lett. 100, 241606 (2012); http://dx.doi.org/10.1063/1.4729549 (4 pages)

Graphene on Rh(111): Scanning tunneling and atomic force microscopies studies

E. N. Voloshina1, Yu. S. Dedkov2, S. Torbrügge2, A. Thissen2, and M. Fonin3

1Physikalische und Theoretische Chemie, Freie Universität Berlin, 14195 Berlin, Germany
2SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany
3Fachbereich Physik, Universität Konstanz, 78457 Konstanz, Germany

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(Received 1 March 2012; accepted 29 May 2012; published online 14 June 2012)

The electronic and crystallographic structure of the graphene/Rh(111) moiré lattice is studied via combination of density-functional theory calculations and scanning tunneling and atomic force microscopy (STM and AFM). Whereas the principal contrast between hills and valleys observed in STM does not depend on the sign of applied bias voltage, the contrast in atomically resolved AFM images strongly depends on the frequency shift of the oscillating AFM tip. The obtained results demonstrate the perspectives of application atomic force microscopy/spectroscopy for the probing of the chemical contrast at the surface.

© 2012 American Institute of Physics

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KEYWORDS and PACS

Keywords

atomic force microscopy, crystal structure, density functional theory, electronic structure, graphene, interface states, interface structure, rhodium, scanning tunnelling microscopy

PACS

  • 73.20.At

    Surface states, band structure, electron density of states

  • 68.35.Ct

    Interface structure and roughness

  • 71.20.-b

    Electron density of states and band structure of crystalline solids

  • 71.15.Mb

    Density functional theory, local density approximation, gradient and other corrections

  • 68.37.Ef

    Scanning tunneling microscopy (including chemistry induced with STM)

  • 68.37.Ps

    Atomic force microscopy (AFM)

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.4729549

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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    References

    Yu. S. Dedkov, M. Fonin, and C. Laubschat, Appl. Phys. Lett. 92, 052506 (2008)APPLAB000092000005052506000001.

    Yu. S. Dedkov, M. Fonin, U. Rüdiger, and C. Laubschat, Appl. Phys. Lett. 93, 022509 (2008)APPLAB000093000002022509000001.

    V. M. Karpan, G. Giovannetti, P. A. Khomyakov, M. Talanana, A. A. Starikov, M. Zwierzycki, J. van der Brink, G. Brocks, and P. J. Kelly, Phys. Rev. Lett. 99, 176602 (2007).

    V. M. Karpan, P. A. Khomyakov, A. A. Starikov, G. Giovannetti, M. Zwierzycki, M. Talanana, G. Brocks, J. van der Brink, and P. J. Kelly, Phys. Rev. B 78, 195419 (2008).

    M. Sicot, S. Bouvron, O. Zander, U. Rüdiger, Yu. S. Dedkov, and M. Fonin, Appl. Phys. Lett. 96, 093115 (2010)APPLAB000096000009093115000001.

    A. T. N'Diaye, S. Bleikamp, P. J. Feibelman, and Th. Michely, Phys. Rev. Lett. 97, 215501 (2006).

    E. Sutter, D. P. Acharya, J. T. Sadowski, and P. Sutter, Appl. Phys. Lett. 94, 133101 (2009)APPLAB000094000013133101000001.

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