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11 Jun 2012

Volume 100, Issue 24, Articles (24xxxx)

Issue Cover Spotlight Figure

Appl. Phys. Lett. 100, 241101 (2012); http://dx.doi.org/10.1063/1.4724309 (3 pages)

Miriam S. Vitiello, Leonardo Viti, Lorenzo Romeo, Daniele Ercolani, G. Scalari, J. Faist, F. Beltram, L. Sorba, and A. Tredicucci
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A solid-state refrigerator based on the electrocaloric effect

Yanbing Jia and Y. Sungtaek Ju

Appl. Phys. Lett. 100, 242901 (2012); http://dx.doi.org/10.1063/1.4729038 (4 pages) | Cited 5 times

Online Publication Date: 12 June 2012

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The electrocaloric effect offers an attractive alternative to the Peltier effect for compact high-efficiency solid-state refrigeration. We report an implementation and experimental characterization of a continuous electrocaloric refrigeration cycle where we use switchable liquid-based thermal interfaces to achieve reliable high-contrast thermal switching between an electrocaloric material and a heat source/sink. The experimentally measured temporal temperature profiles of a cooling load agree well with transient heat transfer modeling results. Our work experimentally validates the feasibility of electrocaloric refrigeration and motivates further applied research on device development.
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07.20.Mc Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment
77.70.+a Pyroelectric and electrocaloric effects

Multiferroic bending mode resonators and studies on temperature dependence of magnetoelectric interactions

D. A. Burdin, D. V. Chashin, N. A. Ekonomov, Y. K. Fetisov, and G. Srinivasan

Appl. Phys. Lett. 100, 242902 (2012); http://dx.doi.org/10.1063/1.4729124 (4 pages)

Online Publication Date: 12 June 2012

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Temperature dependence of the magneto-electric voltage u and resonance frequency are measured at bending mode over T = 220–350 K for Ni-PZT bilayers fabricated by epoxy bonding and by electro-deposition. Both samples show a general decrease in u due to T-dependent permittivity. In epoxy bonded resonators, a further decrease in u occurs due to weakening of mechanical coupling originating from softening of the epoxy. Bending mode frequency varies by 4.5%–16% and is attributed to changes in the Young’s modulus and differential thermal expansion. The results are of importance for composite based devices such as magnetic sensors.
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75.85.+t Magnetoelectric effects, multiferroics
65.40.De Thermal expansion; thermomechanical effects
77.22.Ch Permittivity (dielectric function)
81.15.Pq Electrodeposition, electroplating
81.40.Jj Elasticity and anelasticity, stress-strain relations
81.40.Lm Deformation, plasticity, and creep

Quasi-millimeter-wave absorption behavior in Y/Yb-stabilized zirconia ceramics

Takashi Teranishi, Naoki Akiyama, Keiko Ayano, Hidetaka Hayashi, Akira Kishimoto, Kazuhiro Fujimori, Takuya Hoshina, Hiroaki Takeda, and Takaaki Tsurumi

Appl. Phys. Lett. 100, 242903 (2012); http://dx.doi.org/10.1063/1.4729147 (4 pages)

Online Publication Date: 13 June 2012

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Broadband dielectric spectra from 10 to 1014 Hz were acquired for 8 mol. % Y2O3/Yb2O3-stabilized zirconia (8YSZ and 8YbSZ) ceramics that related the dipole and ionic polarization losses to the absorption efficiency of electromagnetic irradiation. For 24 GHz irradiation, 8YSZ exhibited a higher absorption efficiency than 8YbSZ, resulting in a higher dielectric loss. The difference in the dielectric loss was interpreted as the difference in the loss of the dipoles originating from the fluctuations in the defect associations (Y′ZrVmath and Yb′ZrVmath).
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78.70.Gq Microwave and radio-frequency interactions
77.22.Ch Permittivity (dielectric function)
77.22.Ej Polarization and depolarization
77.22.Gm Dielectric loss and relaxation

Ultrafast carrier dynamics and radiative recombination in multiferroic BiFeO3

Y. M. Sheu, S. A. Trugman, Y.-S. Park, S. Lee, H. T. Yi, S.-W. Cheong, Q. X. Jia, A. J. Taylor, and R. P. Prasankumar

Appl. Phys. Lett. 100, 242904 (2012); http://dx.doi.org/10.1063/1.4729423 (4 pages) | Cited 4 times

Online Publication Date: 13 June 2012

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We report a comprehensive study of ultrafast carrier dynamics in single crystals of multiferroic BiFeO3. Using degenerate femtosecond optical pump-probe spectroscopy, we find that the photoexcited electrons relax to the conduction band minimum through electron-phonon coupling with a ∼1 ps time constant that does not significantly change across the antiferromagnetic transition. Electrons subsequently leave the conduction band and primarily decay via radiative recombination on a nanosecond timescale, as supported by photoluminescence measurements. We find that despite the coexisting ferroelectric and antiferromagnetic orders in BiFeO3, its intrinsic nature results in carrier relaxation similar to that observed in bulk semiconductors.
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72.20.Jv Charge carriers: generation, recombination, lifetime, and trapping
77.80.-e Ferroelectricity and antiferroelectricity
78.55.Hx Other solid inorganic materials
71.38.-k Polarons and electron-phonon interactions

Single domain vs. polydomain [111] 0.72Pb(Mg1/3Nb2/3)O3-0.28PbTiO3 single crystal. Polarization switching, dielectric and pyroelectric properties

Matthias Dietze, Hannelore Katzke, M. Es-Souni, Norbert Neumann, and Hao-Su Luo

Appl. Phys. Lett. 100, 242905 (2012); http://dx.doi.org/10.1063/1.4729749 (3 pages) | Cited 1 time

Online Publication Date: 15 June 2012

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We introduce a poling treatment to induce a single domain structure in [111] single crystals of 0.72Pb(Mg1/3Nb2/3)O3-0.28PbTiO3 (PMN-PT). The properties obtained differ from those known for domain-engineered [111] PMN-PT single crystals. The dielectric, ferroelectric, and pyroelectric properties of this single domain structure are assessed in comparison to polydomain single crystals that were poled by conventional poling treatment. The attributes of the single domain state are a single switching event that reflects in a discontinuity of polarization at the coercive field, a substantially lower dielectric loss (than the multidomain state), and a higher detectivity for pyroelectric applications.
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77.80.Fm Switching phenomena
77.70.+a Pyroelectric and electrocaloric effects
77.22.Ej Polarization and depolarization
77.22.Gm Dielectric loss and relaxation
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