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Appl. Phys. Lett. 100, 052102 (2012); http://dx.doi.org/10.1063/1.3680564 (4 pages)

Quantum Hall effect in bottom-gated epitaxial graphene grown on the C-face of SiC

B. Jouault1, N. Camara1,2, B. Jabakhanji1, A. Caboni3, C. Consejo1, P. Godignon3, D. K. Maude4, and J. Camassel1

1L2C–UMR 5650 Université Montpellier 2/CNRS, 34095 Montpellier cedex 5, France
2GREMAN, UMR 7347, Université de Tours/CNRS, 16 rue Pierre et Marie Curie, 37071 Tours Cedex 2, France
3CNM-IMB-CSIC–Campus UAB 08193 Bellaterra, Barcelona, Spain
4Laboratoire National des Champs Magnétiques Intenses, CNRS-UJF-UPS-INSA, 38042 Grenoble, France

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(Received 29 June 2011; accepted 10 January 2012; published online 30 January 2012)

We demonstrate that the carrier concentration of epitaxial graphene devices grown on the C-face of a SiC substrate is efficiently modulated by a buried gate. The gate is fabricated via the implantation of nitrogen atoms in the SiC crystal. The charge neutrality point is observed close to gate voltage zero, and graphene can be populated by either holes or electrons down to low temperature (1.5 K). The hole concentration is hardly tuned by the gate voltage, possibly because of interface states below the Dirac point. A remarkably large quantum Hall plateau is observed for electrons.

© 2012 American Institute of Physics

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0003-6951 (print)  
1077-3118 (online)

For access to fully linked references, you need to log in.
    I. Deretzis and A. La Magna, Appl. Phys. Lett. 98(2), 023113 (2011)APPLAB000098000002023113000001.

    N. Camara, J. R. Huntzinger, G. Rius, A. Tiberj, N. Mestres, F. Perez-Murano, P. Godignon, and J. Camassel, Phys. Rev. B 80(12), 125410 (2009).

    N. Camara, B. Jouault, A. Caboni, B. Jabakhanji, W. Desrat, E. Pausas, C. Consejo, N. Mestres, P. Godignon, and J. Camassel, Appl. Phys. Lett. 97(9), 093107 (2010)APPLAB000097000009093107000001.

    N. Camara, J.-R. Huntzinger, G. Rius, A. Tiberj, N. Mestres, F. Perez-Murano, P. Godignon, and J. Camassel, Phys. Rev. B 80(12), 125410 (2009).

    L. Magaud, F. Hiebel, F. Varchon, P. Mallet, and J. Y. Veuillen, Phys. Rev. B 79(16), 161405 (2009).


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