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Appl. Phys. Lett. 100, 053101 (2012); http://dx.doi.org/10.1063/1.3679127 (3 pages)

Room-temperature single molecular memory

Shinya Kano1,2, Yasuyuki Yamada3,2, Kentaro Tanaka4,2, and Yutaka Majima1,2,5

1Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
2CREST, Japan Science and Technology Agency, Yokohama 226-8503, Japan
3Research Center for Materials Science, Nagoya University, Nagoya 464-8602, Japan
4Department of Chemistry, Graduate School of Science, Nagoya University, Nagoya 464-8602, Japan
5Department of Printed Electronics Engineering, Sunchon National University, Sunchon 540-742, South Korea

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(Received 21 October 2011; accepted 7 November 2011; published online 30 January 2012)

Single molecular memory operation was observed on a porphyrin derivative by scanning tunneling microscopy at room temperature. A porphyrin derivative with four disulfide groups was chemically synthesized and chemisorbed on a Au(111) surface. Coulomb blockade behaviors and switching behaviors in current-voltage (I-V) characteristics were observed on a single porphyrin derivative by scanning tunneling spectroscopy. Based on the switching behaviors, the memory operation of electrical conductance in the porphyrin derivative was demonstrated by applying a programmed pulse sequence with an on/off ratio of 2.9 at room temperature.

© 2012 American Institute of Physics

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KEYWORDS, PACS, and IPC

PACS

International Patent Classification (IPC)

  • H01L29/00

    Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof

  • H04N5/907

    Using static stores, e.g. storage tubes, semiconductor memories

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PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

For access to fully linked references, you need to log in.
    F. Moresco, G. Meyer, K.-H. Rieder, H. Tang, A. Gourdon, and C. Joachim, Phys. Rev. Lett. 86, 672 (2001).

    Y. Wakayama, T. Kubota, H. Suzuki, T. Kamikado, and S. Mashiko, J. Appl. Phys. 94, 4711 (2003)JAPIAU000094000007004711000001.

    Y. Oyama, Y. Majima, and M. Iwamoto, J. Appl. Phys. 86, 7087 (1999)JAPIAU000086000012007087000001.

    A. E. Hanna and M. Tinkham, Phys. Rev. B 44, 5919 (1991).

    C. T. Black, M. T. Tuominen, and M. Tinkham, Phys. Rev. B 50, 7888 (1994).

    H. Zhang, Y. Yasutake, Y. Shichibu, T. Teranishi, and Y. Majima, Phys. Rev. B 72, 205441 (2005).


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