APL Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Applied Physics Letters / Volume 100 / Issue 5 / NANOSCALE SCIENCE AND TECHNOLOGY

Appl. Phys. Lett. 100, 053109 (2012); http://dx.doi.org/10.1063/1.3679683 (4 pages)

Tapping-mode force spectroscopy using cantilevers with interferometric high-bandwidth force sensors

A. Fatih Sarioglu1, Sergei Magonov2, and Olav Solgaard1

1E. L. Ginzton Laboratory, Stanford University, Stanford, California 94305, USA
2Agilent Technologies, Chandler, Arizona 85226, USA

View MapView Map

(Received 23 October 2011; accepted 7 January 2012; published online 31 January 2012)

We quantitatively map the surface forces and elastic modulus in tapping-mode atomic force microscopy (AFM). To achieve this, we use custom-built cantilevers with interferometric high-bandwidth force sensors that can resolve nonlinear tip-sample interaction forces, combined with a set of algorithms to process the force sensor signals in real-time. Our technique achieves quantitative mechanical measurements, while retaining nanoscale spatial resolution and minimal loading forces in tapping-mode AFM. Moreover, conventional tapping-mode AFM images are not affected and can simultaneously be acquired. As a practical demonstration, we use our technique to quantify the mechanical properties of a polystyrene and linear low-density polyethylene blend.

© 2012 American Institute of Physics

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

atomic force microscopy, cantilevers, elastic moduli, force sensors, polymer blends

PACS

  • 07.79.Lh

    Atomic force microscopes

  • 81.40.Jj

    Elasticity and anelasticity, stress-strain relations

  • 62.20.de

    Elastic moduli

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3679683

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    D. C. Hurley, K. Shen, N. M. Jennett, and J. A. Turner, J. Appl. Phys. 94, 2347 (2003)JAPIAU000094000004002347000001.

    A. F. Sarioglu and O. Solgaard, Appl. Phys. Lett. 93, 023114 (2008)APPLAB000093000002023114000001.

    A. F. Sarioglu and O. Solgaard, J. Appl. Phys. 109, 064316 (2011)JAPIAU000109000006064316000001.


Figures (3)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Tapping-mode force spectroscopy using cantilevers with interferometric high-bandwidth force sensors
  2. Pulsed contact resonance for atomic force microscopy nanomechanical measurements
  3. High‐temperature annealing of thin Au films on Si: Growth of SiO2 nanowires or Au dendritic nanostructures?
  4. All-metallic lateral spin valves using Co2Fe(Ge0.5Ga0.5) Heusler alloy with a large spin signal
  5. Fabrication and magnetic properties of free-standing Ni nanotube arrays with controllable wall thickness
Go to AIP Home
Copyright © American Institute of Physics
close