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Applied Physics Letters / Volume 100 / Issue 6 / PHOTONICS AND OPTOELECTRONICS

Appl. Phys. Lett. 100, 061110 (2012); http://dx.doi.org/10.1063/1.3681794 (4 pages)

X-ray spatial frequency heterodyne imaging

Binbin Wu, Yanan Liu, Christoph Rose-Petruck, and Gerald J. Diebold

Department of Chemistry, Brown University, Providence, Rhode Island 02912, USA

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(Received 9 September 2011; accepted 15 January 2012; published online 7 February 2012)

We derive an expression for the electric field at the image plane from the Kirchhoff-Fresnel integral for a grating in contact with an object in an x-ray, in-line imaging configuration that shows the grating to give a heterodyning effect. We also show how image contrast in a harmonic of the grating is enhanced depending on the first space derivative of the phase function. Experiments are reported where a Fourier component of the image intensity gives contrast at the edges of objects significantly larger than that found with conventional in-line phase contrast imaging.

© 2012 American Institute of Physics

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KEYWORDS, PACS, and IPC

Keywords

Fourier transforms, X-ray imaging

PACS

  • 07.85.Fv

    X- and γ-ray sources, mirrors, gratings, and detectors

International Patent Classification (IPC)

  • H01L31/115

    Devices sensitive to very short wavelength, e.g. x-rays, gamma-rays or corpuscular radiation

  • H04N5/32

    Transforming x-rays

  • H05G

    X-ray technique

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3681794

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    S. Zabler, P. Cloetens, J. P. Guigay, J. Baruchel, and M. Schlenker, Rev. Sci. Instrum. 76, 073705 (2005)RSINAK000076000007073705000001.

    A. Pogany, D. Gao, and S. Wilkins, Rev. Sci. Instrum. 68, 2774 (1997)RSINAK000068000007002774000001.

    G. Cao, T. Hamilton, C. M. Laperle, C. Rose-Petruck, and G. J. Diebold, J. Appl. Phys. 105, 102002 (2009)JAPIAU000105000010102002000001.


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