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12 Nov 2012

Volume 101, Issue 20, Articles (20xxxx)

Issue Cover Spotlight Figure

Appl. Phys. Lett. 101, 203102 (2012); http://dx.doi.org/10.1063/1.4747717 (4 pages)

Hyukjin Jung and Ki-Hun Jeong
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Tomographic effects of near-field microwave microscopy in the investigation of muscle cells interacting with multi-walled carbon nanotubes

Marco Farina, Andrea Di Donato, Tamara Monti, Tiziana Pietrangelo, Tatiana Da Ros, Antonio Turco, Giuseppe Venanzoni, and Antonio Morini

Appl. Phys. Lett. 101, 203101 (2012); http://dx.doi.org/10.1063/1.4767518 (4 pages)

Online Publication Date: 12 November 2012

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In this work, we introduce a hybrid atomic-force/near-field scanning microwave microscope, exploiting the tomographic capabilities of the microwave microscopy to explore structures of relevant interest, namely, samples involving both biological and non-biological materials at the same time. In particular, we show imaging of C2C12 muscle cells grown in the presence of bundles of multi-walled carbon nanotubes: here, the microwave microscopy, by virtue of its tomographic potentiality, highlights how cells incorporate some nanotubes in their fibers.
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87.17.Uv Biotechnology of cell processes
87.17.Ee Growth and division
87.19.Ff Muscles
87.64.Dz Scanning tunneling and atomic force microscopy
87.80.-y Biophysical techniques (research methods)

Monolithic polymer microlens arrays with antireflective nanostructures

Hyukjin Jung and Ki-Hun Jeong

Appl. Phys. Lett. 101, 203102 (2012); http://dx.doi.org/10.1063/1.4747717 (4 pages)

Online Publication Date: 12 November 2012

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This work reports a novel method for fabricating monolithic polymer microlens arrays with antireflective nanostructures (AR-MLAs) at wafer level. The antireflective nanostructures (ARS) were fabricated by etching the curved surface of polymer microlens with a metal annealed nanoisland mask. The effective refractive index of ARS was controlled with the etch profile of nanostructures to reduce the mismatch in refractive indices at air-lens interface. The reflectance of AR-MLAs decreases below 4% from 490 nm to 630 nm in wavelength. The lens transmission significantly increases by 67% across the visible spectrum by minimizing the reflection and absorption, compared to that of MLAs without ARS.
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42.79.Bh Lenses, prisms and mirrors
42.79.Wc Optical coatings
42.86.+b Optical workshop techniques
42.70.Jk Polymers and organics

Reactive-ion-etched graphene nanoribbons on a hexagonal boron nitride substrate

D. Bischoff, T. Krähenmann, S. Dröscher, M. A. Gruner, C. Barraud, T. Ihn, and K. Ensslin

Appl. Phys. Lett. 101, 203103 (2012); http://dx.doi.org/10.1063/1.4765345 (4 pages)

Online Publication Date: 12 November 2012

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We report on the fabrication and electrical characterization of both single layer graphene micron-sized devices and nanoribbons on a hexagonal boron nitride substrate. We show that the micron-sized devices have significantly higher mobility and lower disorder density compared to devices fabricated on silicon dioxide substrate in agreement with previous findings. The transport characteristics of the reactive-ion-etched graphene nanoribbons on hexagonal boron nitride, however, appear to be very similar to those of ribbons on a silicon dioxide substrate. We perform a detailed study in order to highlight both similarities as well as differences. Our findings suggest that the edges have an important influence on transport in reactive-ion-etched graphene nanodevices.
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81.07.Bc Nanocrystalline materials
81.65.Cf Surface cleaning, etching, patterning
72.80.Vp Electronic transport in graphene
72.20.Fr Low-field transport and mobility; piezoresistance

Homogeneous pinhole free 1 nm Al2O3 tunnel barriers on graphene

B. Dlubak, M.-B. Martin, C. Deranlot, K. Bouzehouane, S. Fusil, R. Mattana, F. Petroff, A. Anane, P. Seneor, and A. Fert

Appl. Phys. Lett. 101, 203104 (2012); http://dx.doi.org/10.1063/1.4765348 (3 pages)

Online Publication Date: 12 November 2012

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We report on the topographical and electrical characterisations of 1 nm thick Al2O3 dielectric films on graphene. The Al2O3 is grown by sputtering a 0.6 nm Al layer on graphene and subsequentially oxidizing it in an O2 atmosphere. The Al2O3 layer presents no pinholes and is homogeneous enough to act as a tunnel barrier. A resistance-area product in the mega-ohm micrometer-square range is found. Comparatively, the growth of Al2O3 by evaporation does not lead to well-wetted films on graphene. Application of this high quality sputtered tunnel barrier to efficient spin injection in graphene is discussed.
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77.84.Bw Elements, oxides, nitrides, borides, carbides, chalcogenides, etc.
81.15.Cd Deposition by sputtering
68.55.at Other materials

Why do atomic force microscopy force curves still exhibit jump to contact?

Mario S. Rodrigues, Luca Costa, Joël Chevrier, and Fabio Comin

Appl. Phys. Lett. 101, 203105 (2012); http://dx.doi.org/10.1063/1.4766172 (4 pages)

Online Publication Date: 13 November 2012

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The force between two particles as a function of distance is one of the most fundamental curves in physics. Here, we describe how the force feedback microscope can routinely measure the tip-surface interaction in the entire range of distances with a sensitivity of 1 pN and in different media. The method allows to measure simultaneously the force, force gradient, and damping from solely the knowledge of the lever spring constant. The jump to contact is avoided and thus it is possible to follow the brutal nucleation of a water bridge between the tip and the surface.
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07.79.Lh Atomic force microscopes
07.10.Pz Instruments for strain, force, and torque

Nanoxerography utilizing bipolar charge patterns

Kyunghoon Lim, Jung-Rok Lee, Heechul Lee, Peter V. Pikhitsa, Sukbeom You, Chang Gyu Woo, Pilnam Kim, Kahp Y. Suh, and Mansoo Choi

Appl. Phys. Lett. 101, 203106 (2012); http://dx.doi.org/10.1063/1.4766180 (5 pages)

Online Publication Date: 13 November 2012

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We report a nanoxerography utilizing alternating bipolar surface charge patterns. Unlike a conventional nanoxerography using unipolar charge patterns, the present concept generates convex shaped equipotential planes with large curvature that can act as nanoscopic electrostatic lenses. Through these lenses, positively charged aerosol nanoparticles are focused into the center region of the negative surface charge pattern leading to the significant reduction of particle deposition width. We also demonstrate that the focusing capability can be controlled by changing ion flow rates. Numerical simulations of the trajectory and deposition of charged particles were done to support experimental results.
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81.07.-b Nanoscale materials and structures: fabrication and characterization
82.70.Rr Aerosols and foams
73.40.-c Electronic transport in interface structures

Plasmon-induced fluorescence and electroluminescence from porphine molecules on GaAs(110) in a scanning tunneling microscope

Svenja Mühlenberend, Natalia L. Schneider, Markus Gruyters, and Richard Berndt

Appl. Phys. Lett. 101, 203107 (2012); http://dx.doi.org/10.1063/1.4767351 (3 pages)

Online Publication Date: 13 November 2012

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Surface plasmon polaritons of the tip of a scanning tunneling microscope are used to induce fluorescence from (5,10,15,20)-tetraphenyl-21 H,23 H-porphine molecules on GaAs(110) surfaces at very low coverages. Fluorescence spectra exhibiting vibrationally resolved Q-band transitions show that the luminescence is of molecular origin. The emission is not directly induced by the tunneling current. Rather, radiationless energy transfer from plasmon modes of the tip leads to molecular excitation.
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78.55.Kz Solid organic materials
63.20.-e Phonons in crystal lattices
71.36.+c Polaritons (including photon-phonon and photon-magnon interactions)
73.20.Mf Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
78.60.Fi Electroluminescence

Free volume change of elongated polyethylene films studied using a positron probe microanalyzer

Toshitaka Oka, Nagayasu Oshima, Ryoichi Suzuki, Akira Uedono, Masanori Fujinami, and Yoshinori Kobayashi

Appl. Phys. Lett. 101, 203108 (2012); http://dx.doi.org/10.1063/1.4766457 (4 pages)

Online Publication Date: 13 November 2012

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Free volume change of low density polyethylene (LDPE) and high density polyethylene (HDPE) films upon mechanical deformation was microscopically investigated by positron probe microanalysis (PPMA). The ortho-positronium (o-Ps) lifetimes were gradually shortened by uniaxial deformation, indicative of shrinkage of the free volume. The o-Ps intensity for HDPE increased by deformation, whereas that for LDPE varied little. It suggests that destruction of crystallites plays an important role in the deformation of HDPE. PPMA is demonstrated to be a promising, powerful probe investigating free volume changes, at different local points subjected to different degrees of deformation, in elongated polymers.
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68.60.Bs Mechanical and acoustical properties
81.40.Lm Deformation, plasticity, and creep
62.20.F- Deformation and plasticity

High-performance solution-processed plasmonic Ni nanochain-Al2O3 selective solar thermal absorbers

Xiaoxin Wang, Haofeng Li, Xiaobai Yu, Xiaoling Shi, and Jifeng Liu

Appl. Phys. Lett. 101, 203109 (2012); http://dx.doi.org/10.1063/1.4766730 (5 pages) | Cited 1 time

Online Publication Date: 13 November 2012

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Selective solar thermal absorber coating is an important component of concentrated solar power systems. It maximizes the absorption of solar spectrum and minimizes thermal radiation losses in the mid-infrared regime. In this letter, we demonstrate a solution-processed plasmonic Ni nanochain-Al2O3 selective solar thermal absorber with a high solar absorptance >90% and a low thermal emittance loss <10%. Unlike conventional graded-index cermet coatings, the spectral selectivity is tailored by the lengths of Ni nanochains, elimating the requirement of costly vacuum deposition for stringent thickness control. These results open a path to utilize plasmonics for low-cost, high-performance solar thermal systems.
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42.79.Ek Solar collectors and concentrators
42.70.-a Optical materials
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