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3 Dec 2012

Volume 101, Issue 23, Articles (23xxxx)

Issue Cover Spotlight Figure

Appl. Phys. Lett. 101, 233101 (2012); http://dx.doi.org/10.1063/1.4749281 (3 pages)

S. A. Studenikin, J. Thorgrimson, G. C. Aers, A. Kam, P. Zawadzki, Z. R. Wasilewski, A. Bogan, and A. S. Sachrajda
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Integrating magnetoresistive sensors with microelectromechanical systems for noise reduction

Jiafei Hu, Mengchun Pan, Wugang Tian, Dixiang Chen, and Feilu Luo

Appl. Phys. Lett. 101, 234101 (2012); http://dx.doi.org/10.1063/1.4769903 (4 pages) | Cited 1 time

Online Publication Date: 4 December 2012

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1/f noise is the dominant detection limit of magnetoresistive (MR) sensors at low frequency. The vertical motion flux modulation (VMFM) integrating with microelectromechanical systems (MEMS) can reduce 1/f noise by tens or hundreds of times, although thermal-mechanical noise possibly has strong impact on the detection ability of VMFM sensors like common MEMS sensors. Surprisingly, the voltage noise originated from thermal-mechanical noise is actually far less than the noise base of MR sensors, which indicates a great perspective for the integration of MEMS and MR sensors.
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07.55.-w Magnetic instruments and components
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
07.10.Cm Micromechanical devices and systems

Size-variable droplet actuation by interdigitated electrowetting electrode

Jianfeng Chen, Yuhua Yu, Jia Li, Yongjun Lai, and Jia Zhou

Appl. Phys. Lett. 101, 234102 (2012); http://dx.doi.org/10.1063/1.4769433 (4 pages)

Online Publication Date: 5 December 2012

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We propose electrowetting on dielectric (EWOD) electrodes to actuate size-variable droplets. By using interdigitated fingers and maximizing them in optimized construction, we can control droplets in different sizes with the same electrode array automatically. We both do the theory calculation and experiment verification to study the electrode with rectangular fingers. It is found that the electrode with triangle fingers can actuate droplets as small as 1/36 of that actuated by conventional square electrode array. It can actuate large droplets more efficiently than rectangular fingers. This work provides an approach to achieve multifunctional EWOD devices in the future.
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07.10.Cm Micromechanical devices and systems
47.55.D- Drops and bubbles
47.65.-d Magnetohydrodynamics and electrohydrodynamics
47.85.L- Flow control
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices

Critical tensile strain and water vapor transmission rate for nanolaminate films grown using Al2O3 atomic layer deposition and alucone molecular layer deposition

Shih-Hui Jen, Byoung H. Lee, Steven M. George, Robert S. McLean, and Peter F. Carcia

Appl. Phys. Lett. 101, 234103 (2012); http://dx.doi.org/10.1063/1.4766731 (3 pages)

Online Publication Date: 5 December 2012

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Critical tensile strains (CTSs) and water vapor transmission rates (WVTRs) were measured for nanolaminate films grown on polyimide substrates using Al2O3 atomic layer deposition (ALD) and alucone molecular layer deposition (MLD). Nanolaminate composition was controlled by varying the ratio of ALD:MLD cycles during film growth. For ∼100 nm film thicknesses, the CTS obtained its highest value of ∼1.0% for the 3:1 nanolaminate. The WVTR decreased dramatically versus nanolaminate composition and reached the measurement sensitivity limit at WVTR ∼1 × 10−4 g/(m2day) for the 7:2, 5:1, and 6:1 nanolaminates. The ALD:MLD nanolaminates may be useful as flexible gas/vapor diffusion barriers on polymers.
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81.16.-c Methods of micro- and nanofabrication and processing
81.40.Lm Deformation, plasticity, and creep
62.20.F- Deformation and plasticity
68.55.at Other materials
68.60.Bs Mechanical and acoustical properties
81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)

Influence of a superficial field of residual stress on the propagation of surface waves—Applied to the estimation of the depth of the superficial stressed zone

Marc Duquennoy, Mohammadi Ouaftouh, Julien Deboucq, Jean-Etienne Lefebvre, Frédéric Jenot, and Mohamed Ourak

Appl. Phys. Lett. 101, 234104 (2012); http://dx.doi.org/10.1063/1.4768434 (3 pages)

Online Publication Date: 5 December 2012

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In this study, we were interested in the dispersion of surface waves caused by the presence of a micrometric field of residual stress on the surface of an amorphous medium. We have shown that in relation to surface waves, a stressed structure like this is comparable to a layer on substrate type structure. The design and implementation of SAW-IDT MEMS sensors enabled quasi-monochromatic Rayleigh-type surface waves to be generated and the dispersion phenomenon to be studied over a wide range of frequencies for different superficial fields of residual stress. The thicknesses of the stressed cortical zones were estimated with good accuracy using an inverse method.
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68.35.Iv Acoustical properties
07.10.Cm Micromechanical devices and systems

Quantitative phase imaging of electron waves using selected-area diffraction

J. Yamasaki, K. Ohta, S. Morishita, and N. Tanaka

Appl. Phys. Lett. 101, 234105 (2012); http://dx.doi.org/10.1063/1.4769457 (5 pages) | Cited 1 time

Online Publication Date: 6 December 2012

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A method for quantitative phase imaging of electron waves was developed based on diffractive imaging. Phase images over field of views of more than 100 nm were reconstructed from pairs of a selected-area diffraction pattern and a transmission electron microscopy image. The illumination wave field was reconstructed uniformly with a phase fluctuation of less than 0.1 rad and a spatial resolution of 2-3 nm. The phase image for wedge-shaped silicon was converted to a thickness map, which agreed quantitatively with electron energy-loss spectroscopy. The present method is also valid for arbitrary-shaped samples even if dynamical diffraction effects are significant.
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42.79.Dj Gratings
79.20.Uv Electron energy loss spectroscopy
42.30.Wb Image reconstruction; tomography

Field-induced periodic chiral pattern in the Nx phase of achiral bimesogens

V. P. Panov, R. Balachandran, J. K. Vij, M. G. Tamba, A. Kohlmeier, and G. H. Mehl

Appl. Phys. Lett. 101, 234106 (2012); http://dx.doi.org/10.1063/1.4769458 (4 pages) | Cited 2 times

Online Publication Date: 6 December 2012

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Some hydrocarbon-linked mesogenic dimers are known to exhibit an additional nematic phase (Nx) in the temperature range below the conventional nematic (Nu) phase. One of the features of this phase is the presence of optical response typically found in chiral systems, while the involved molecules are non-chiral. We demonstrate that the two domains of opposite handedness found in planar cells can be controlled/induced by the external electric field and these form periodic striped patterns. The effect of frequency and amplitude of the electric field on the periodicity and formation of the domain pattern is investigated.
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61.30.Gd Orientational order of liquid crystals; electric and magnetic field effects on order
64.70.M- Transitions in liquid crystals

Analyzing threshold pressure limitations in microfluidic transistors for self-regulated microfluidic circuits

Sung-Jin Kim, Ryuji Yokokawa, and Shuichi Takayama

Appl. Phys. Lett. 101, 234107 (2012); http://dx.doi.org/10.1063/1.4769985 (4 pages) | Cited 1 time

Online Publication Date: 7 December 2012

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This paper reveals a critical limitation in the electro-hydraulic analogy between a microfluidic membrane-valve (μMV) and an electronic transistor. Unlike typical transistors that have similar on and off threshold voltages, in hydraulic μMVs, the threshold pressures for opening and closing are significantly different and can change, even for the same μMVs depending on overall circuit design and operation conditions. We explain, in particular, how the negative values of the closing threshold pressures significantly constrain operation of even simple hydraulic μMV circuits such as autonomously switching two-valve microfluidic oscillators. These understandings have significant implications in designing self-regulated microfluidic devices.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
85.30.Tv Field effect devices
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