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24 Dec 2012

Volume 101, Issue 26, Articles (26xxxx)

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Appl. Phys. Lett. 101, 263501 (2012); http://dx.doi.org/10.1063/1.4772532 (4 pages)

Youngki Yoon and Sayeef Salahuddin
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Measurement of the valence band-offset in a PbSe/ZnO heterojunction by x-ray photoelectron spectroscopy

Lin Li, Jijun Qiu, Binbin Weng, Zijian Yuan, Xiaomin Li, Xiaoyan Gan, Ian R. Sellers, and Zhisheng Shi

Appl. Phys. Lett. 101, 261601 (2012); http://dx.doi.org/10.1063/1.4773512 (4 pages) | Cited 1 time

Online Publication Date: 26 December 2012

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A heterojunction of PbSe/ZnO has been grown by molecular beam epitaxy. X-ray photoelectron spectroscopy was used to directly measure the valence-band offset (VBO) of the heterojunction. The VBO, ΔEV, was determined as 2.51 ± 0.05 eV using the Pb 4p3/2 and Zn 2p3/2 core levels as a reference. The conduction-band offset, ΔEC, was, therefore, determined to be 0.59 ± 0.05 eV based on the above ΔEV value. This analysis indicates that the PbSe/ZnO heterojunction forms a type I (Straddling Gap) heterostructure.
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73.20.At Surface states, band structure, electron density of states
79.60.Jv Interfaces; heterostructures; nanostructures
81.15.Hi Molecular, atomic, ion, and chemical beam epitaxy
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
68.55.ag Semiconductors

Epitaxial growth of (111)-oriented LaAlO3/LaNiO3 ultra-thin superlattices

S. Middey, D. Meyers, M. Kareev, E. J. Moon, B. A. Gray, X. Liu, J. W. Freeland, and J. Chakhalian

Appl. Phys. Lett. 101, 261602 (2012); http://dx.doi.org/10.1063/1.4773375 (3 pages)

Online Publication Date: 27 December 2012

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The epitaxial stabilization of a single layer or superlattice structures composed of complex oxide materials on polar (111) surfaces is severely burdened by the reconstructions at the interface that commonly arise to neutralize the polarity. We report on the synthesis of high quality LaNiO3/mLaAlO3 pseudo cubic (111) superlattices on polar (111)-oriented LaAlO3, the proposed complex oxide candidate for a topological insulating behavior. Comprehensive X-Ray diffraction measurements, reflection high energy electron diffraction, and element specific resonant X-ray absorption spectroscopy affirm their high structural and chemical quality. The study offers an opportunity to fabricate interesting interface and topology controlled (111)-oriented superlattices based on ortho-nickelates.
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68.55.aj Insulators
68.35.Ct Interface structure and roughness
73.21.Cd Superlattices
78.70.Dm X-ray absorption spectra
81.15.Hi Molecular, atomic, ion, and chemical beam epitaxy
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