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15 Oct 1979

Volume 35, Issue 8, pp. 575-647

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Measurement of the input impedance of a RF biased SQUID

F. Bordoni, P. Carelli, I. Modena, and G. L. Romani

Appl. Phys. Lett. 35, 642 (1979); http://dx.doi.org/10.1063/1.91236 (2 pages)

Online Publication Date: 7 August 2008

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An experimental method to measure the imaginary and real part of the input impedance of an rf biased SQUID is described. The experimental results are in good agreement with the predictions of a detailed theoretical model of the rf SQUID, recently published. In particular it seems confirmed that the real part of the input impedance has a negative value which depends on the square of the input signal frequency. This effect must be taken into account whenever a SQUID is used to measure high frequency signals.
Show PACS
85.25.-j Superconducting devices
74.50.+r Tunneling phenomena; Josephson effects
07.55.-w Magnetic instruments and components

Isolation of type‐2 magnetic contrast in the SEM by a lock‐in technique

Oliver C. Wells

Appl. Phys. Lett. 35, 644 (1979); http://dx.doi.org/10.1063/1.91237 (3 pages) | Cited 1 time

Online Publication Date: 7 August 2008

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The backscattered electron (BSE) signal in the scanning electron microscope (SEM) can be modulated, under the proper experimental conditions, by magnetic fields inside the specimen. This modulation is typically less than 1% of the collected current, and this must be amplified so as to be clearly visible in the recorded image. We have found that unwanted topographic contrasts can be reduced in comparison with this magnetic contrast by a lock‐in technique. With a 1‐μm permalloy film as the sample, the domain walls can be moved repetitively by applying a sinusoidal magnetic field. If the video waveform is processed using a lock‐in amplifier controlled by this same signal, then the portions of the domain walls that move are emphasized in the image. Parts of the image which are not affected by the modulating magnetic field are strongly attenuated in the processed image.
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07.55.-w Magnetic instruments and components
07.78.+s Electron, positron, and ion microscopes; electron diffractometers
75.60.Ch Domain walls and domain structure
75.70.-i Magnetic properties of thin films, surfaces, and interfaces
FREE

Erratum: Long‐term Hall‐type conversion by vacancy diffusion in Hg1−xCdxTe at room temperature

G. Nimtz, B. Schlicht, and R. Dornhaus

Appl. Phys. Lett. 35, 647 (1979); http://dx.doi.org/10.1063/1.91271 (1 page)

Online Publication Date: 7 August 2008

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Abstract Unavailable
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61.72.jd Vacancies
61.72.jj Interstitials
71.45.Gm Exchange, correlation, dielectric and magnetic response functions, plasmons
99.10.Cd Errata
FREE

Erratum: Buried‐grid fabrication by silicon liquid‐phase epitaxy

B. Jayant Baliga

Appl. Phys. Lett. 35, 647 (1979); http://dx.doi.org/10.1063/1.91272 (1 page)

Online Publication Date: 7 August 2008

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Abstract Unavailable
Show PACS
61.72.U- Doping and impurity implantation
81.10.Fq Growth from melts; zone melting and refining
99.10.Cd Errata
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