APL Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App Facebook

BROWSE VOLUMES

Year Range: 
Search Issue | RSS Feeds RSS
Previous Issue Next Issue

1 Dec 1980

Volume 37, Issue 11, pp. 973-1051

Page 2 of 2 Pages Previous Page | Jump to Page

Intensity-dependent absorption in semiconductors

Alan F. Stewart and Michael Bass

Appl. Phys. Lett. 37, 1040 (1980); http://dx.doi.org/10.1063/1.91756 (4 pages) | Cited 15 times

Online Publication Date: 23 July 2008

Full Text: | Download PDF

Show Abstract
Laser calorimetry has been used to study intensity-dependent absorption processes in semiconductors at 1.06 and 1.318 μm. New measurements of two-photon absorption and two-photon-excited free carriers are reported. Saturation of the one-photon absorption has been observed and evidence is presented for a pulse width dependence of the two-photon absorption.
Show PACS
78.90.+t Other topics in optical properties, condensed matter spectroscopy and other interactions of particles and radiation with condensed matter (restricted to new topics in section 78)
42.50.Md Optical transient phenomena: quantum beats, photon echo, free-induction decay, dephasings and revivals, optical nutation, and self-induced transparency
07.20.Fw Calorimeters

Direct solid‐state precipitation‐processed A15 (Nb3A1) superconducting material

M. Hong and J. W. Morris

Appl. Phys. Lett. 37, 1044 (1980); http://dx.doi.org/10.1063/1.91757 (2 pages) | Cited 4 times

Online Publication Date: 23 July 2008

Full Text: | Download PDF

Show Abstract
A ’’solid‐state precipitation’’ process was used to prepare superconducting tapes containing Nb3Al in a niobium matrix. Small ingots of Nb–(17–19 at . %)Al were prepared by arc melting, homogenizing, quenching, warm rolling into tape, and aging at 750–900°C to precipitate the A15 phase. Transmission electron microscopy studies revealed Nb3Al precipitation in fine particles which formed a semicontinuous network over subgrain boundaries fromed by the recovery of deformation‐induced dislocations. Promising high‐field critical currents were obtained (Jc∼104 A/cm2 in a field of 14 T at 4.2 K).
Show PACS
74.25.-q Properties of superconductors

A multitrack ferroelectric array with inherent track access

J. M. Geary

Appl. Phys. Lett. 37, 1046 (1980); http://dx.doi.org/10.1063/1.91758 (2 pages) | Cited 1 time

Online Publication Date: 23 July 2008

Full Text: | Download PDF

Show Abstract
A monolithic array of parallel ferroelectric tracks has been fabricated by selectively etching through a gadolinium molybdate platelet. The tracks project at right angles from a single access track. Domain walls produced at a nucleator move first up the access track and then out across the tracks of the array. Both raster scanning and scanning of a single selected track have been demonstrated. These two modes of operation should find appropriate application to two‐dimensional ferroelectric image scanners and to ferroelectric analog read‐only memories, respectively.
Show PACS
85.50.-n Dielectric, ferroelectric, and piezoelectric devices
77.80.Dj Domain structure; hysteresis
85.60.Gz Photodetectors (including infrared and CCD detectors)

Controlled fabrication of multilayer soft‐x‐ray mirrors

Eberhard Spiller, Armin Segmüller, Jack Rife, and Rolf‐Peter Haelbich

Appl. Phys. Lett. 37, 1048 (1980); http://dx.doi.org/10.1063/1.91759 (3 pages) | Cited 48 times

Online Publication Date: 23 July 2008

Full Text: | Download PDF

Show Abstract
Multilayer mirrors have been fabricated for various angles of incidence throughout the wavelength range λ=1.5–160 Å. Reflectivity increases by more than a factor 103 over the best single‐film reflectors have been obtained. Measured reflectivities are around 10% near normal incidence in the λ=45–160‐Å wavelength region and above 50% near grazing incidence (grazing angle 1°–2°) for λ=1.54 Å. The required thickness control has been achieved by monitoring the reflectivity of the films in situ during the deposition.
Show PACS
42.25.Hz Interference
81.15.Cd Deposition by sputtering
68.60.-p Physical properties of thin films, nonelectronic
78.66.-w Optical properties of specific thin films
78.67.-n Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures
FREE

Erratum: An x‐ray resonator based on successive reflections of a surface wave

J. Bremer and L. Kaihola

Appl. Phys. Lett. 37, 1051 (1980); http://dx.doi.org/10.1063/1.92109 (1 page)

Online Publication Date: 23 July 2008

Full Text: | Download PDF

Abstract Unavailable
Show PACS
07.85.-m X- and γ-ray instruments
42.60.Da Resonators, cavities, amplifiers, arrays, and rings
99.10.Cd Errata
FREE

Erratum: Open‐circuit voltage of induced‐junction solar cells

M. K. Alam and Y. T. Yeow

Appl. Phys. Lett. 37, 1051 (1980); http://dx.doi.org/10.1063/1.92110 (1 page)

Online Publication Date: 23 July 2008

Full Text: | Download PDF

Abstract Unavailable
Show PACS
84.60.Jt Photoelectric conversion
73.40.Qv Metal-insulator-semiconductor structures (including semiconductor-to-insulator)
72.40.+w Photoconduction and photovoltaic effects
99.10.Cd Errata

Erattum: Implementation of a novel procedure to optimize electron optical systems through the use of orthogonal functions

J. P. van der Merwe

Appl. Phys. Lett. 37, 1051 (1980); http://dx.doi.org/10.1063/1.92111 (1 page)

Online Publication Date: 23 July 2008

Full Text: | Download PDF

Abstract Unavailable
Show PACS
41.20.Cv Electrostatics; Poisson and Laplace equations, boundary-value problems
41.20.Gz Magnetostatics; magnetic shielding, magnetic induction, boundary-value problems
02.60.-x Numerical approximation and analysis
02.70.-c Computational techniques; simulations
99.10.Cd Errata
Page 2 of 2 Pages Previous Page | Jump to Page
Close

Google Calendar

ADVERTISEMENT

Go to AIP Home   © AIP Publishing LLC
close