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Applied Physics Letters / Volume 56 / Issue 7
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Appl. Phys. Lett. 56, 665 (1990); http://dx.doi.org/10.1063/1.102730 (3 pages)

Electronic analog of the electro‐optic modulator

Supriyo Datta and Biswajit Das

School of Electrical Engineering, Purdue University, West Lafayette, Indiana 47907

(Received 3 October 1989; accepted 5 December 1989)

We propose an electron wave analog of the electro‐optic light modulator. The current modulation in the proposed structure arises from spin precession due to the spin‐orbit coupling in narrow‐gap semiconductors, while magnetized contacts are used to preferentially inject and detect specific spin orientations. This structure may exhibit significant current modulation despite multiple modes, elevated temperatures, or a large applied bias.

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KEYWORDS and PACS

Keywords

OPTICAL MODULATION, SEMICONDUCTOR DEVICES, OPTICAL MODULATORS, DESIGN, ELECTRO−OPTICAL EFFECTS, POLARIZATION

PACS

  • 85.30.Tv

    Field effect devices

  • 42.79.Hp

    Optical processors, correlators, and modulators

  • 73.40.Kp

    III-V semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions

  • 71.70.Ej

    Spin-orbit coupling, Zeeman and Stark splitting, Jahn-Teller effect

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.102730

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

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  3. S. Datta, Superlatt. Microstruct. 6, 83 (1989); [Inspec] [ISI]
    D. C. Miller, R. Lake, S. Datta, M. S. Lundstrom, M. R. Melloch, and R. Reifenberger, in Proceedings of the International Symposium on Nanostructure Physics and Fabrication, College Station, Texas, March 13–15, 1989, edited by M. A. Reed and W. P. Kirk (Academic, New York, 1989), p. 165.
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    also Proceedings of the 17th International Conference on Physics and Semiconductors, San Francisco, Aug. 6–10, 1984 (Springer, New York, 1984), p. 321.
  8. J. Luo, H. Munekata, F. F. Fang, and P. J. Stiles, Phys. Rev. B 38, 10142 (1988). [MEDLINE]
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  10. B. Das, S. Datta, and R. Reifenberger (unpublished).
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  12. G. Bergmann, Solid State Commun. 42, 815 (1982). [Inspec] [ISI]

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