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Appl. Phys. Lett. 61, 557 (1992); http://dx.doi.org/10.1063/1.107835 (3 pages)
Surface segregation of In atoms during molecular beam epitaxy and its influence on the energy levels in InGaAs/GaAs quantum wells
(Received 24 February 1992; accepted 19 May 1992)
Surface segregation of In atoms during molecular beam epitaxy (MBE) and its influence on the energy levels in InGaAs/GaAs quantum wells (QWs) were systematically studied using secondary‐ion mass spectroscopy (SIMS) and photoluminescence (PL). Strong dependence of In surface segregation on the growth conditions was found; when the growth temperature was raised from 370 to 520 °C, the segregation length was observed to increase from 0.8 up to 2.9 nm, accompanied by an appreciable peak energy shift in the PL spectra of the InGaAs/GaAs QWs. The correlation between In surface segregation and the energy levels in InGaAs/GaAs QWs was clarified for the first time.
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J. M. Moison, C. Guille, F. Houzay, F. Barthe, and M. V. Rompay, Phys. Rev. B 40, 6149 (1989).
J. M. Gerard and J. Y. Martin, Phys. Rev. B 45, 6313 (1992).
B. Jogai and P. W. Yu, Phys. Rev. B 41, 12 650 (1990), and references therein.
Since the segregation probability R is assumed to be independent of the number of impinging In atoms for simplicity, the surface In composition can exceed one monolayer when R>1−x0. This might be physically unrealistic, however, this simple model has proven to be successful for reproducing the observed well-width dependence of the PL energy. For detailed models of surface segregation during MBE, see for example W.-X. Ni, J. Knall, M. A. Hasan, G. V. Hansson, J.-E. Sundgren, S. A. Barnett, L. C. Markert, and J. E. Greene, Phys. Rev. B 40, 10 449 (1989).
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