LOG IN or SELECT A PURCHASE OPTION:
Appl. Phys. Lett. 63, 973 (1993); http://dx.doi.org/10.1063/1.109862 (3 pages)
Comparison of the physical properties of GaN thin films deposited on (0001) and (0112) sapphire substrates
(Received 12 February 1993; accepted 30 April 1993)
A direct comparison of the physical properties of GaN thin films is made as a function of the choice of substrate orientations. Gallium nitride single crystals were grown on (0001) and (0112) sapphire substrates by metalorganic chemical vapor deposition. Better crystallinity with fine ridgelike facets is obtained on the (0112) sapphire. Also lower carrier concentration and higher mobilities indicate both lower nitrogen vacancies and less oxygen incorporation on the (0112) sapphire. The results of this study show better physical properties of GaN thin films achieved on (0112) sapphire.
RELATED DATABASES
To view database links for this article,
you need to log in.
KEYWORDS and PACS
ARTICLE DATA
Digital Object Identifier
PUBLICATION DATA
For access to fully linked references, you need to log in.
-
S. Yoshida, S. Misawa, and S. Gonda, Appl. Phys. Lett. 42, 427 (1983APPLAB000042000005000427000001).
T. Sasaki and S. Zembutsu, J. Appl. Phys. 61, 2533 (1987JAPIAU000061000007002533000001).
B.-C. Chung and M. Gershenzon, J. Appl. Phys. 72, 651 (1992JAPIAU000072000002000651000001).
G. Burns, F. Dacol, J. C. Marinace, and B. A. Scott, Appl. Phys. Lett. 22, 356 (1973APPLAB000022000008000356000001).
For access to citing articles, you need to log in.
















This Publication
Scitation
SPIN
Google Scholar
PubMed