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Applied Physics Letters / Volume 67 / Issue 20

Appl. Phys. Lett. 67, 2983 (1995); http://dx.doi.org/10.1063/1.114833 (3 pages)

Application to optical components of dielectric porous silicon multilayers

C. Mazzoleni and L. Pavesi

I.N.F.M. and Dipartimento di Fisica, Università di Trento, via Sommarive 14, I‐38050 Povo, Trento, Italy

(Received 14 June 1995; accepted 7 September 1995)

Narrow‐band color filters have been integrated on porous silicon layers. Distributed Bragg reflectors and Fabry–Pérot interference filters based on layered porous silicon samples are demonstrated. The effects of narrowing and tuning the porous silicon emission band are shown in structures composed by Fabry–Pérot filters integrated on top of thick porous silicon layers. © 1995 American Institute of Physics.

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KEYWORDS and PACS

Keywords

BRAGG REFLECTION, FABRY−PEROT INTERFEROMETER, FILTERS, MULTILAYERS, POROUS MATERIALS, SILICON

PACS

  • 42.79.Ci

    Filters, zone plates, and polarizers

  • 78.66.Db

    Elemental semiconductors and insulators

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.114833

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

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    References

    G. Vincent, Appl. Phys. Lett. 64, 2367 (1994)APPLAB000064000018002367000001.

    L. Pavesi, M. Ceschini, G. Mariotto, E. Zanghellini, O. Bisi, M. Anderle, L. Calliari, M. Fedrizzi, and L. Fedrizzi, J. Appl. Phys. 75, 1118 (1994)JAPIAU000075000002001118000001.


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