Using an n
-type (311)A GaAs substrate we have fabricated in situ
back-gated GaAs/(Al,Ga)As hole gases with mobilities of μ = 1.1×106 cm2 V−1 s−1
at 30 mK. We have investigated both experimentally and theoretically the scattering mechanisms that limit the mobility in both the 
directions. Using a combination of front and back gates to keep the carrier density constant, we can distinguish between scattering mechanisms which are primarily dependent on the carrier density and those that are sensitive to the shape of the hole wave function. This approach also eliminates complications arising from the variations of the Fermi surface anisotropy with carrier density. Our data confirms that anisotropic interface roughness scattering, arising from the nature of the (311)A GaAs surface, is the dominant scattering mechanism at carrier densities down to ps = 5.0×1010 cm−2
. © 1997 American Institute of Physics.