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1 Jun 1998

Volume 72, Issue 22, pp. 2779-2913

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Scanning thermal microscopy using batch fabricated thermocouple probes

G. Mills, H. Zhou, A. Midha, L. Donaldson, and J. M. R. Weaver

Appl. Phys. Lett. 72, 2900 (1998); http://dx.doi.org/10.1063/1.121453 (3 pages) | Cited 42 times

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We have developed scanning thermal microscopy probes for high resolution analysis of thermal properties in an atomic force microscope (AFM). Electron beam lithography and silicon micromachining have been used to batch fabricate Au/Pd thermocouples situated at the end of Si3N4 cantilevers. The cantilevers are patterned on the side of traditional style pyramidal AFM tips, giving a new shape of probe which is favorable for access to specimens containing significant topographic variation. Tip radius is approximately 50 nm and the probe has a macroscopic opening angle of 70°. The probes were scanned in the repulsive mode using a conventional AFM. Force feedback was optically employed to give topographic and thermal maps simultaneously by maintaining a constant force of approximately 5 nN. During initial scans using a photothermal test specimen, 80 nm period metal gratings were thermally resolved. © 1998 American Institute of Physics.
Show PACS
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
07.79.Lh Atomic force microscopes
68.35.B- Structure of clean surfaces (and surface reconstruction)
07.20.Dt Thermometers

In situ observation of electric field induced agglomeration of carbon black in epoxy resin

Torsten Prasse, Lionel Flandin, Karl Schulte, and Wolfgang Bauhofer

Appl. Phys. Lett. 72, 2903 (1998); http://dx.doi.org/10.1063/1.121454 (3 pages) | Cited 40 times

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This letter reports on the influence of a static electric field applied by metal electrodes on the agglomeration process of carbon black (CB) in epoxy resin. The growth of dendrites from the anode into the material is observed in situ by optical transmission microscopy. A percolating network is seen to form, combined with a drastic reduction in the sample resistivity. This behavior can be explained by taking into account the electrostatic interaction of the charged CB particles. The final resistance for composites with a given CB content can be controlled within a range of several decades by varying the applied voltage and the curing temperature of the mixture. © 1998 American Institute of Physics.
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61.41.+e Polymers, elastomers, and plastics
68.70.+w Whiskers and dendrites (growth, structure, and nonelectronic properties)
82.70.-y Disperse systems; complex fluids

Micro-electromagnets for atom manipulation

M. Drndić, K. S. Johnson, J. H. Thywissen, M. Prentiss, and R. M. Westervelt

Appl. Phys. Lett. 72, 2906 (1998); http://dx.doi.org/10.1063/1.121455 (3 pages) | Cited 62 times

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Micro-electromagnets for atom manipulation have been constructed, including magnetic mirrors (serpentine patterns) and traps (circular patterns). They consist of planar micron-scale Au wires on sapphire substrates fabricated using lithography and electroplating. At liquid nitrogen or helium temperatures in vacuum the wires support currents of several amperes with current density ∼ 108 A/cm2 and power dissipation ∼ 10 kW/cm2, and they produce magnetic fields to 0.3 T and gradients to 103 T/cm. The micro-electromagnet mirror was used to deflect a beam of metastable helium atoms at grazing angles ∼ 0.5 mrad. © 1998 American Institute of Physics.
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41.85.Lc Particle beam focusing and bending magnets, wiggler magnets, and quadrupoles
07.55.Db Generation of magnetic fields; magnets
03.75.Be Atom and neutron optics
37.20.+j Atomic and molecular beam sources and techniques

Electron emission mechanism from cubic boron nitride-coated molybdenum emitters

B. L. McCarson, R. Schlesser, M. T. McClure, and Z. Sitar

Appl. Phys. Lett. 72, 2909 (1998); http://dx.doi.org/10.1063/1.121492 (3 pages) | Cited 10 times

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The energy distribution of field-emitted electrons from Mo tips coated with intrinsic cubic boron nitride (c-BN) was studied in an effort to determine the origin of the emitted electrons. Voltage-dependent field-emission energy distribution (V-FEED) spectra were collected from the Mo emitters under ultra-high-vacuum conditions both before and after being coated. Emission current at a given voltage increased by as much as two orders of magnitude for the c-BN-coated emitters relative to bare emitters. The energy of field-emitted electrons from the c-BN-coated emitters was linearly dependent upon the applied voltage. Extrapolation of V-FEED data from c-BN-coated emitters to the flatband condition evidenced that the electrons were emitted from the conduction-band minimum of the c-BN coating at the c-BN/vacuum interface. © 1998 American Institute of Physics.
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79.70.+q Field emission, ionization, evaporation, and desorption
73.20.At Surface states, band structure, electron density of states

A nanotube-based field-emission flat panel display

Q. H. Wang, A. A. Setlur, J. M. Lauerhaas, J. Y. Dai, E. W. Seelig, and R. P. H. Chang

Appl. Phys. Lett. 72, 2912 (1998); http://dx.doi.org/10.1063/1.121493 (2 pages) | Cited 293 times

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A matrix addressable diode flat panel display has been fabricated using a carbon nanotube–epoxy composite as the electron emission source. Field-emission uniformity has been confirmed by measuring the I–V curves of pixels across the panel. This prototype display demonstrates well-lit pixels under ±150 V biasing signals. The “on” and “off” of the pixels are well controlled by the half voltage “off-pixel” method. Further improvement of this technology may lead to easy-to-make and inexpensive flat panel displays. © 1998 American Institute of Physics.
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42.79.Kr Display devices, liquid-crystal devices
07.07.Hj Display and recording equipment, oscilloscopes, TV cameras, etc.
79.70.+q Field emission, ionization, evaporation, and desorption
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
61.82.Rx Nanocrystalline materials
85.40.Hp Lithography, masks and pattern transfer
81.07.-b Nanoscale materials and structures: fabrication and characterization
81.16.-c Methods of micro- and nanofabrication and processing
85.35.-p Nanoelectronic devices
61.46.-w Structure of nanoscale materials
81.65.Cf Surface cleaning, etching, patterning
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