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12 Jan 1998

Volume 72, Issue 2, pp. 135-266

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Smoothing of YBa2Cu3O7−δ films by ion cluster beam bombardment

W. K. Chu, Y. P. Li, J. R. Liu, J. Z. Wu, S. C. Tidrow, N. Toyoda, J. Matsuo, and I. Yamada

Appl. Phys. Lett. 72, 246 (1998); http://dx.doi.org/10.1063/1.120699 (3 pages) | Cited 17 times

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Smoothing high-temperature superconductor (HTS) surfaces, especially HTS thin-film surfaces, is crucial for HTS thin-film device processing. In this letter, we describe a method to planarize the surface of a YBa2Cu3O7−δ HTS film down to a smoothness with a standard deviation of 1 nm or better. The method includes first smoothing the HTS surface by ion cluster beam bombardment, followed by annealing in oxygen ambient to regrow the damaged surface layer. Additional YBCO layers can be grown epitaxially on the treated surface, even without removing the top surface layer, which contained some residual damage after annealing. This method can be integrated into HTS circuit fabrication as a key step of planarization. © 1998 American Institute of Physics.
Show PACS
74.72.-h Cuprate superconductors
74.78.-w Superconducting films and low-dimensional structures
79.20.Rf Atomic, molecular, and ion beam impact and interactions with surfaces
68.35.B- Structure of clean surfaces (and surface reconstruction)
61.80.Jh Ion radiation effects

Transport and structural properties of the top and bottom grain boundaries in YBa2Cu3O7−δ step-edge Josephson junctions

Filomena Lombardi, Z. G. Ivanov, G. M. Fischer, E. Olsson, and T. Claeson

Appl. Phys. Lett. 72, 249 (1998); http://dx.doi.org/10.1063/1.120700 (3 pages) | Cited 4 times

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We present a method to study separately the electrical transport properties of the grain boundaries (GBs) formed at the top and at the bottom edges of YBa2Cu3O7−δ(YBCO) step-edge Josephson junctions. The step-edge junctions were fabricated on (100) LaAlO3 steps using tilted Ar ion milling to define the electrodes and the microbridges. Due to the shadowing effect of the step, a continuous YBCO stripe remains along and at the bottom of the step on both sides of a microbridge. We found that the top GB is responsible for the weak link behavior of our step-edge junctions. The transport properties were correlated with the different microstructural properties of the two GBs formed at the edges of the step. © 1998 American Institute of Physics.
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74.72.-h Cuprate superconductors
74.50.+r Tunneling phenomena; Josephson effects
74.25.Sv Critical currents
74.25.F- Transport properties
61.72.Mm Grain and twin boundaries

How to achieve in-phase locking in small-inductance Josephson junction ladder arrays

M. Basler, W. Krech, and K. Yu. Platov

Appl. Phys. Lett. 72, 252 (1998); http://dx.doi.org/10.1063/1.120701 (3 pages) | Cited 4 times

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We present the results of an analytical study of phase locking in externally loaded two-dimensional Josephson junction ladder arrays with small, but non-vanishing ring inductances. A Lyapunov stability based condition is found controlling realization of the radiating in-phase oscillation regime. © 1998 American Institute of Physics.
Show PACS
85.25.Cp Josephson devices
84.30.Ng Oscillators, pulse generators, and function generators
84.40.Dc Microwave circuits
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