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19 Jan 1998

Volume 72, Issue 3, pp. 269-391

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Sequential position readout from arrays of micromechanical cantilever sensors

H. P. Lang, R. Berger, C. Andreoli, J. Brugger, M. Despont, P. Vettiger, Ch. Gerber, J. K. Gimzewski, J. P. Ramseyer, E. Meyer, and H.-J. Güntherodt

Appl. Phys. Lett. 72, 383 (1998); http://dx.doi.org/10.1063/1.120749 (3 pages) | Cited 62 times

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Sequential position readout from a microfabricated array of eight cantilever-type sensors (silicon technology) is demonstrated. In comparison with single sensors we find that mechanical disturbances from noise, such as from vibrations, turbulent gas flow, or abrupt pressure changes, can be effectively removed in array sensors by recording difference signals with respect to reference cantilevers. We demonstrate that chemically specific responses can be extracted in a noisy environment using a sensor to detect specific chemical interactions and an uncoated cantilever as reference. © 1998 American Institute of Physics.
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07.10.Cm Micromechanical devices and systems
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Point-contact electrodes to probe charging effects in individual ultrasmall cobalt clusters

R. Desmicht, G. Faini, V. Cros, A. Fert, F. Petroff, and A. Vaurès

Appl. Phys. Lett. 72, 386 (1998); http://dx.doi.org/10.1063/1.120744 (3 pages) | Cited 21 times

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A new technique to probe a single nanometer-scale magnetic particle by measuring the tunneling current through point-contact electrodes is described. The tunnel junctions are formed by a bulk cobalt bottom electrode, a monolayer of ultrasmall Co clusters sandwiched between two Al2O3 barriers and a point-contact top electrode, defined by e-beam lithography and permitting to study the quantum transport through an isolated cluster. We report on single electron charging effects such as Coulomb blockade and Coulomb staircase which are undoubtedly consistent with the tunneling through a single Co cluster. One of our devices exhibits a Coulomb gap of 380 mV which is, to our knowledge, one of the largest values ever reported in metallic granular systems. © 1998 American Institute of Physics.
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73.23.Hk Coulomb blockade; single-electron tunneling
75.50.Tt Fine-particle systems; nanocrystalline materials
73.61.At Metal and metallic alloys

Stable field-induced electron emission from a solidified liquid metal ion source

L. W. Chen and Y. L. Wang

Appl. Phys. Lett. 72, 389 (1998); http://dx.doi.org/10.1063/1.120745 (3 pages) | Cited 7 times

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Stable field-induced electron emission is derived from a tungsten tip covered by indium which has been solidified from its liquid state during an ion emission process. By choosing different ion emission currents at the beginning of the solidification process, the final geometry of the solidified emitter can be reshaped and the characteristics of the electron emission changed. The Fowler–Nordheim equation is used to infer the geometry of the electron emitter prepared by various solidification processes. The dual ion/electron point source is expected to have high potential applications in focused ion and electron beam technologies. © 1998 American Institute of Physics.
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79.70.+q Field emission, ionization, evaporation, and desorption
07.77.Ka Charged-particle beam sources and detectors
29.25.Ni Ion sources: positive and negative
64.70.D- Solid-liquid transitions
29.25.Bx Electron sources
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