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28 Sep 1998

Volume 73, Issue 13, pp. 1757-1915

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Bend strain tolerance of critical currents for YBa2Cu3O7 films deposited on rolled-textured (001)Ni

C. Park, D. P. Norton, J. D. Budai, D. K. Christen, D. Verebelyi, R. Feenstra, D. F. Lee, A. Goyal, D. M. Kroeger, and M. Paranthaman

Appl. Phys. Lett. 73, 1904 (1998); http://dx.doi.org/10.1063/1.122321 (3 pages) | Cited 28 times

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Superconducting YBa2Cu3O7/CeO2/YSZ/CeO2 multilayer structures were grown on rolled-textured (001)Ni using pulsed-laser deposition. Critical current densities greater than 1 MA/cm2 were obtained for relatively thick YBa2Cu3O7 films. The compressive and tensile bend strain tolerance of critical currents for the YBa2Cu3O7 films deposited on these rolling-assisted biaxially textured substrates was also determined. These conductors retained up to 80% of their unstrained critical currents for applied compressive bend diameters as small as 1.5 cm and tensile bend diameters of 3.2 cm. The degradation of Jc is caused by the formation and propagation of transverse cracks. The results also suggest a correlation between bend-strain tolerance for these coated conductors and total oxide layer thickness. © 1998 American Institute of Physics.
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74.78.-w Superconducting films and low-dimensional structures
74.25.Sv Critical currents
74.72.-h Cuprate superconductors
74.25.Ld Mechanical and acoustical properties, elasticity, and ultrasonic attenuation

Back-side reflectance of high Tc superconducting thin films in the far infrared

Z. M. Zhang, A. R. Kumar, V. A. Boychev, D. B. Tanner, L. R. Vale, and D. A. Rudman

Appl. Phys. Lett. 73, 1907 (1998); http://dx.doi.org/10.1063/1.122322 (3 pages) | Cited 3 times

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We have measured the far-infrared reflectance of YBa2Cu3O7−δ high Tc superconducting (HTS) films, for radiation incident on the substrate side (back-side illumination), in the spectral region from 15 to 650 cm−1 and at temperatures between 10 and 300 K. The HTS films were deposited on Si substrates (with YSZ/CeO2 buffer layers) by pulsed laser ablation. The extremely large temperature dependence of the reflectance experimentally demonstrates the feasibility of using HTS films to construct far-infrared intensity modulators. In this letter, we present the measured results, as well as an analysis based on thin-film optics and a simple two-fluid model. © 1998 American Institute of Physics.
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78.66.-w Optical properties of specific thin films
42.79.Hp Optical processors, correlators, and modulators
74.78.-w Superconducting films and low-dimensional structures
74.72.-h Cuprate superconductors

Subterahertz signal crosstalk in transmission line interconnects

Marc Currie, Roman Sobolewski, and Thomas Y. Hsiang

Appl. Phys. Lett. 73, 1910 (1998); http://dx.doi.org/10.1063/1.122323 (3 pages) | Cited 1 time

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A low-temperature electro-optic sampling system was implemented to study the crosstalk of picosecond pulses between on-chip microstrip interconnects. With a submillivolt sensitivity and a subpicosecond temporal response, this system has allowed noninvasive, nodal testing of superconducting Nb integrated circuits. We have characterized pulse propagation and the crosstalk arising from two microstrip waveguides crossing perpendicular to each other, with one signal line crossing above the other. These results provided direct feedback for improving computer simulations of superconducting electronic circuits, but they are representative of any high-speed interconnect in today’s very large scale integrated circuit technology. © 1998 American Institute of Physics.
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85.25.Hv Superconducting logic elements and memory devices; microelectronic circuits
84.40.Az Waveguides, transmission lines, striplines
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