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2 Nov 1998

Volume 73, Issue 18, pp. 2543-2690

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Erratum: “Metglas thin film with as-deposited domain alignment for smart sensor and actuator applications” [Appl. Phys. Lett. 70, 526 (1997)]

Yong Lu and Arokia Nathan

Appl. Phys. Lett. 73, 2690 (1998); http://dx.doi.org/10.1063/1.122555 (1 page)

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75.70.Kw Domain structure (including magnetic bubbles and vortices)
75.80.+q Magnetomechanical effects, magnetostriction
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
99.10.Cd Errata
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Erratum: “Ferroelectric characterization of highly (0001)-oriented YMnO3 thin films grown by chemical solution deposition” [Appl. Phys. Lett. 73, 903 (1998)]

Woo-Chul Yi, Joong-Seon Choe, Chang-Rok Moon, Sook-Il Kwun, and Jong-Gul Yoon

Appl. Phys. Lett. 73, 2690 (1998); http://dx.doi.org/10.1063/1.122556 (1 page)

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Abstract Unavailable
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77.55.-g Dielectric thin films
77.84.Bw Elements, oxides, nitrides, borides, carbides, chalcogenides, etc.
77.80.-e Ferroelectricity and antiferroelectricity
68.55.-a Thin film structure and morphology
79.60.Dp Adsorbed layers and thin films
82.80.Yc Rutherford backscattering (RBS), and other methods of chemical analysis
81.15.Lm Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)
99.10.Cd Errata
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