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21 Dec 1998

Volume 73, Issue 25, pp. 3629-3786

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Bulk and surface characterization of a dewetting thin film polymer bilayer

H. Ade, D. A. Winesett, A. P. Smith, S. Anders, T. Stammler, C. Heske, D. Slep, M. H. Rafailovich, J. Sokolov, and J. Stöhr

Appl. Phys. Lett. 73, 3775 (1998); http://dx.doi.org/10.1063/1.122891 (3 pages) | Cited 17 times

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We have monitored the progression of the dewetting of a partially brominated polystyrene (PBrS) thin film on top of a polystyrene (PS) thin film with scanning transmission x-ray microscopy (STXM) as well as photoemission electron microscopy (PEEM). We mapped the projected thickness of each constituent polymer species and the total thickness of the film with STXM, while we determined the surface composition with PEEM. Our data show that the PBrS top layer becomes encapsulated during the later stages of dewetting and that atomic force microscopy topographs cannot be utilized to determine the contact angle between PBrS and PS. © 1998 American Institute of Physics.
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81.15.Lm Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)
68.55.-a Thin film structure and morphology
68.35.B- Structure of clean surfaces (and surface reconstruction)
78.70.Dm X-ray absorption spectra

An optimal magnetic tip configuration for magnetic-resonance force microscopy of microscale buried features

John A. Marohn, Raúl Fainchtein, and Doran D. Smith

Appl. Phys. Lett. 73, 3778 (1998); http://dx.doi.org/10.1063/1.122892 (3 pages) | Cited 20 times

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To date, magnetic-resonance force microscopes employing a magnetic-field gradient source mounted to a microcantilever have suffered from a deleterious dependence of the effective cantilever spring constant on the external magnetic field. A “magnet-on-tip” configuration is introduced in which this dependence has been decreased by at least 200 fold, making it feasible to perform arbitrary-sample micron-scale magnetic resonance force microscopy at very high magnetic field. Alternating-gradient cantilever magnetometry is used to quantify the effect and to prove that the existing model of the tip-field interaction is only qualitatively correct. A model is proposed which quantitatively describes the tip-field interaction in the traditional tip configuration. © 1998 American Institute of Physics.
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07.79.Pk Magnetic force microscopes
07.55.Ge Magnetometers for magnetic field measurements

Analytical descriptions of the tapping-mode atomic force microscopy response

Lugen Wang

Appl. Phys. Lett. 73, 3781 (1998); http://dx.doi.org/10.1063/1.122893 (3 pages) | Cited 33 times

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The tapping-mode atomic force microscopy response has been analyzed by the Krylov–Bogolubov–Mitropolsky asymptotic method. Due to the presence of repulsive force, attractive force and damping in the tip-sample interaction, the response exhibits complicate nonlinear phenomena. The numerical and experimental results shows that the phenomena can be well described by this approximation solution when the driving frequency is close to the free resonance frequency and the setpoint amplitude ratio is larger than 0.4. © 1998 American Institute of Physics.
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68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
68.35.B- Structure of clean surfaces (and surface reconstruction)

A study of electron field emission as a function of film thickness from amorphous carbon films

R. D. Forrest, A. P. Burden, S. R. P. Silva, L. K. Cheah, and X. Shi

Appl. Phys. Lett. 73, 3784 (1998); http://dx.doi.org/10.1063/1.122894 (3 pages) | Cited 65 times

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The electron field-emission properties of hydrogenated amorphous carbon and nitrogenated tetrahedral amorphous carbon thin films are examined by measuring the field-emission current as a function of the applied macroscopic electric field. The experimental results indicate the existence of an optimum film thickness for low-threshold electron field emission. The predictions of various emission models are compared to the experimental results. © 1998 American Institute of Physics.
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79.70.+q Field emission, ionization, evaporation, and desorption
68.55.-a Thin film structure and morphology
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