Indium–zinc oxide films (ZnxInyOx+1.5y), with x/y = 0.08–12.0, are grown by low-pressure metal-organic chemical vapor deposition using the volatile metal–organic precursors In(TMHD)3 and Zn(TMHD)2 (TMHD = 2,2,6,6–tetramethyl–3,5–heptanedionato). Films are smooth (rms roughness = 40–50 Å) with complex microstructures which vary with composition. The highest conductivity is found at x/y = 0.33, with σ = 1000 S/cm (n-type; carrier density=3.7×1020 cm3; mobility=18.6 cm2/V s; dσ/dT<0). The optical transmission window of such films is broader than Sn-doped In2O3, and the absolute transparency rivals or exceeds that of the most transparent conductive oxides. X-ray diffraction, high resolution transmission electron microscopy, microdiffraction, and high resolution energy dispersive X-ray analysis show that such films are composed of a layered ZnkIn2O3+k phase precipitated in a cubic In2O3:Zn matrix. © 1998 American Institute of Physics.