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29 Mar 1999

Volume 74, Issue 13, pp. 1785-1922

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Transverse strain responses in the electrostrictive poly(vinylidene fluoride–trifluorethylene) copolymer

Z.-Y. Cheng, T.-B. Xu, Vivek Bharti, Shexi Wang, and Q. M. Zhang

Appl. Phys. Lett. 74, 1901 (1999); http://dx.doi.org/10.1063/1.123707 (3 pages) | Cited 41 times

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A large transverse electrostrictive strain S1 with a high elastic strain energy density is observed along the drawing direction in the stretched poly(vinylidene fluoride–trifluorethylene) copolymer film under a proper electron irradiation treatment condition, which results in a ratio of ∣S1/S3∣ larger than 1 where S3 is the longitudinal strain. In contrast, unstretched films generate a relatively small transverse strain with a small ratio of ∣S1/S3∣ (∼0.25). Hence, in this copolymer system, the ratio of ∣S1/S3∣ can be varied over a broad range. In addition, a large volume strain, which amounts to about half of the longitudinal strain, is observed in the films investigated. © 1999 American Institute of Physics.
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77.84.Jd Polymers; organic compounds
77.65.Ly Strain-induced piezoelectric fields
77.22.Ej Polarization and depolarization
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials
61.80.Fe Electron and positron radiation effects
61.82.Pv Polymers, organic compounds

Crystal structures and ferroelectric properties of SrBi2Ta2O9 and Sr0.8Bi2.2Ta2O9

Y. Shimakawa, Y. Kubo, Y. Nakagawa, T. Kamiyama, H. Asano, and F. Izumi

Appl. Phys. Lett. 74, 1904 (1999); http://dx.doi.org/10.1063/1.123708 (3 pages) | Cited 205 times

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Crystal structures of ferroelectric materials of stoichiometric SrBi2Ta2O9 (TC = 300 °C) and Sr-deficient-and-Bi-excess Sr0.8Bi2.2Ta2O9 (TC = 400 °C) were refined by neutron powder diffraction. Bi2O2 layer and TaO6 octahedra are considerably distorted and atomic displacements along the a axis cause ferroelectric spontaneous polarization. In Sr0.8Bi2.2Ta2O9, both Bi substitution and cation vacancies at the Sr site were revealed and a chemical composition of (Sr0.82Bi0.12)Bi2Ta2O9.0 was obtained. The calculated polarization of Sr0.8Bi2.2Ta2O9 is larger than that of the stoichiometric sample, which is consistent with observations of remanent polarization in thin-film capacitors. The Bi substitution and the cation vacancies at the Sr site enhance structural distortion in the TaO6 octahedra and lead to the larger ferroelectric spontaneous polarization and the higher Curie temperature. © 1999 American Institute of Physics.
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77.80.Dj Domain structure; hysteresis
77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
77.22.Ej Polarization and depolarization
61.72.J- Point defects and defect clusters
61.66.Bi Elemental solids
61.66.Dk Alloys
61.66.Fn Inorganic compounds

Differences in nature of defects between SrBi2Ta2O9 and Bi4Ti3O12

B. H. Park, S. J. Hyun, S. D. Bu, T. W. Noh, J. Lee, H.-D. Kim, T. H. Kim, and W. Jo

Appl. Phys. Lett. 74, 1907 (1999); http://dx.doi.org/10.1063/1.123709 (3 pages) | Cited 98 times

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X-ray photoemission spectroscopy measurements were executed to compare the nature of defects in SrBi2Ta2O9 (SBT) and Bi4Ti3O12 (BTO) films. In the SBT film, it was found that the oxygen ions at the metal–oxygen octahedra were much more stable than those at the Bi2O2 layers. On the other hand, for the BTO film, oxygen vacancies could be induced both at the titanium–oxygen octahedra and at the Bi2O2 layers. We suggested that the difference in stability of the metal–oxygen octahedra should be related to different fatigue behaviors of the SBT and the BTO films. © 1999 American Institute of Physics.
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68.55.-a Thin film structure and morphology
77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
79.60.Bm Clean metal, semiconductor, and insulator surfaces
61.72.J- Point defects and defect clusters
77.55.-g Dielectric thin films
77.80.-e Ferroelectricity and antiferroelectricity

Does freezing in PbMg1/3Nb2/3O3 relaxor manifest itself in nonlinear dielectric susceptibility?

A. K. Tagantsev and A. E. Glazounov

Appl. Phys. Lett. 74, 1910 (1999); http://dx.doi.org/10.1063/1.123710 (3 pages) | Cited 29 times

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A possible anomaly in the temperature dependence of nonlinear dielectric susceptibility χnl of relaxor ferroelectrics related with the freezing phase transition was investigated. First, based on the phenomenological approach, the anomaly in the χnl was analyzed, including its shape, sign, and crystalline anisotropy. Second, the theoretical results were applied to the analysis of experimental data on nonlinear dielectric permittivity of single crystals of PbMg1/3Nb2/3O3 (PMN) relaxor. It was concluded that in contrast to earlier publications, there is no evidence for the anomaly in χnl(T) of PMN related with the freezing transition. © 1999 American Institute of Physics.
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77.80.-e Ferroelectricity and antiferroelectricity
77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
77.22.Ch Permittivity (dielectric function)
77.22.Gm Dielectric loss and relaxation
77.80.B- Phase transitions and Curie point
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