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5 Apr 1999

Volume 74, Issue 14, pp. 1933-2093

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Polymer solution light-emitting devices

Shun-Chi Chang, Yang Yang, and Qibing Pei

Appl. Phys. Lett. 74, 2081 (1999); http://dx.doi.org/10.1063/1.123764 (3 pages) | Cited 13 times

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Traditional conjugated polymer electroluminescent devices are thin-film solid-state devices consisting of a thin polymer film sandwiched between two electrodes. In this letter, we demonstrate the generation of luminescence from polymer solutions in a compact polymer solution configuration. This unique polymer solution light-emitting device (SLED) consists of a thin layer of a polymer solution sandwiched between two transparent indium–tin–oxide/glass substrates. When biased, the device turns on at slightly above the band-gap energy and emits bright luminescence. The emission spectrum is consistent with the photoluminescence spectrum obtained from the polymer solution. We suggest that the mechanism of the SLED is due to the electrogenerated chemiluminescence effect. The SLED combines the advantages of low operating voltage, and easy and low-cost fabrication. The SLED is also a highly transparent emissive device when transparent materials are used for the electrodes and the substrates. © 1999 American Institute of Physics.
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85.60.Jb Light-emitting devices
78.66.Qn Polymers; organic compounds
78.60.Ps Chemiluminescence
78.55.Bq Liquids
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Controlled fabrication of metallic electrodes with atomic separation

A. F. Morpurgo, C. M. Marcus, and D. B. Robinson

Appl. Phys. Lett. 74, 2084 (1999); http://dx.doi.org/10.1063/1.123765 (3 pages) | Cited 105 times

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We report a technique for fabricating metallic electrodes on insulating substrates with separations on the 1 nm scale. The fabrication technique, which combines lithographic and electrochemical methods, provides atomic resolution without requiring sophisticated instrumentation. The process is simple, controllable, reversible, and robust, allowing rapid fabrication of electrode pairs with high yield. We expect the method to prove useful in interfacing molecular-scale structures to macroscopic probes and electronic devices. © 1999 American Institute of Physics.
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85.65.+h Molecular electronic devices
85.40.Hp Lithography, masks and pattern transfer
81.07.-b Nanoscale materials and structures: fabrication and characterization
81.16.-c Methods of micro- and nanofabrication and processing
85.35.-p Nanoelectronic devices
82.45.-h Electrochemistry and electrophoresis

Quantitative theory for laser-generated Lamb waves in orthotropic thin plates

J. C. Cheng and S. Y. Zhang

Appl. Phys. Lett. 74, 2087 (1999); http://dx.doi.org/10.1063/1.123766 (3 pages) | Cited 19 times

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A quantitative theory for modeling the laser-generated transient ultrasonic Lamb waves propagating along arbitrary directions in orthotropic thin plates is presented by employing an expansion method of the generalized Lamb wave modes. The displacement is expressed by a summation of the symmetric and antisymmetric modes in the surface stress-free orthotropic plate, and it is particularly appropriate for wave form analyses of Lamb wave in thin plates because one needs only to evaluate a few of the lowest order modes. The transient wave forms are analyzed in the thermoelastic regime and the oil coating generation method for a transversely isotropic plate. The results show that the theory provides a quantitative analysis to characterize anisotropic properties and elastic stiffness properties of the orthotropic plates by the laser-generated Lamb wave detection. © 1999 American Institute of Physics.
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43.35.Pt Surface waves in solids and liquids
68.35.Gy Mechanical properties; surface strains
43.35.Ud Thermoacoustics, high temperature acoustics, photoacoustic effect
78.20.hb Piezo-optical, elasto-optical, acousto-optical, and photoelastic effects
46.25.Hf Thermoelasticity and electromagnetic elasticity (electroelasticity, magnetoelasticity)
46.40.Cd Mechanical wave propagation (including diffraction, scattering, and dispersion)
46.70.De Beams, plates, and shells
43.35.Zc Use of ultrasonics in nondestructive testing, industrial processes, and industrial products
81.70.Cv Nondestructive testing: ultrasonic testing, photoacoustic testing

Identification of two patterns in magnetic force microscopy of shape memory alloys

B. R. A. Neves and M. S. Andrade

Appl. Phys. Lett. 74, 2090 (1999); http://dx.doi.org/10.1063/1.123767 (3 pages) | Cited 4 times

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In this work, we report on the observation of two coexisting patterns in magnetic force microscopy (MFM) images of shape memory alloys. The MFM signal of both patterns presents similar behavior with tip–surface separation. An investigation on the origin of these patterns presents strong evidence that both are of magnetic nature only and, furthermore, can be assigned as bulk and surface-related, respectively. © 1999 American Institute of Physics.
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68.35.B- Structure of clean surfaces (and surface reconstruction)
75.70.Rf Surface magnetism
62.20.F- Deformation and plasticity
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Erratum: “Controlled doping of phthalocyanine layers by cosublimation with acceptor molecules: A systematic seebeck and conductivity study” [Appl. Phys. Lett. 73, 3202 (1998)]

M. Pfeiffer, A. Beyer, T. Fritz, and K. Leo

Appl. Phys. Lett. 74, 2093 (1999); http://dx.doi.org/10.1063/1.123768 (1 page) | Cited 2 times

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Abstract Unavailable
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73.61.Ph Polymers; organic compounds
68.55.Ln Defects and impurities: doping, implantation, distribution, concentration, etc.
73.50.Lw Thermoelectric effects
61.72.up Other materials
99.10.Cd Errata
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Erratum: “Ohmic contacts formed by electrodeposition and physical vapor deposition on p-GaN” [Appl. Phys. Lett. 73, 3402 (1998)]

J. M. DeLucca, H. S. Venugopalan, S. E. Mohney, and R. F. Karlicek

Appl. Phys. Lett. 74, 2093 (1999); http://dx.doi.org/10.1063/1.123769 (1 page)

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Abstract Unavailable
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73.40.Ns Metal-nonmetal contacts
81.15.Pq Electrodeposition, electroplating
81.15.Cd Deposition by sputtering
81.05.Bx Metals, semimetals, and alloys
61.72.Cc Kinetics of defect formation and annealing
73.40.Cg Contact resistance, contact potential
99.10.Cd Errata
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