Browse - Applied Physics Letters

APPLIED BIOPHYSICS

Select this Article

Separation of a single cell by red-laser manipulation

Shuji Shikano, Koji Horio, Yoshihiro Ohtsuka, and Yuzuro Eto

Appl. Phys. Lett. 75, 2671 (1999); http://dx.doi.org/10.1063/1.125114 (3 pages)

Full Text: Read Online (HTML) | Download PDF

Show Abstract

A single cell of yeast was separated from a bulk sample of yeast without causing damage to the cell. A focused red-laser light beam was used for trapping and transporting the cell. A specially designed microchannel separator played an essential role in the success of the separation. © 1999 American Institute of Physics.

Show PACS

87.80.Cc	Optical trapping
87.17.Jj	Cell locomotion, chemotaxis

INTERDISCIPLINARY AND GENERAL PHYSICS

Select this Article

Studies on the reaction of the 5′-phosphorimidazolide of adenosine with Cu(II)-exchanged hectorite

T. L. Porter, R. Whitehorse, M. P. Eastman, and E. D. Bain

Appl. Phys. Lett. 75, 2674 (1999); http://dx.doi.org/10.1063/1.125115 (3 pages) | Cited 3 times

Full Text: Read Online (HTML) | Download PDF

Show Abstract

The role of clay minerals in the prebiotic synthesis of nucleotide oligomers has received considerable attention in recent years. Scanning force microscopy and matrix-assisted laser desorption/ionization time-of-flight mass spectrometry are used to identify oligomers of adenylic acid formed on the clay mineral Cu(II)-exchanged hectorite in simulated prebiotic cycling experiments. Electron-spin resonance and x-ray diffraction data indicate that the monomer (5′-phosphorimidazolide of adenosine, or ImpA) penetrates into the intergallery regions of the mineral substrate, and complexes the gallery Cu(II) cations. It is postulated that polymerization of the monomer is initiated in the clay intergallery regions, producing oligomers of adenylic acid up to 8 units in length or more. © 1999 American Institute of Physics.

Show PACS

87.14.G-	Nucleic acids
87.15.R-	Reactions and kinetics
82.35.-x	Polymers: properties; reactions; polymerization

Select this Article

Gas-assisted focused-ion-beam lithography of a diamond (100) surface

A. Datta, Yuh-Renn Wu, and Y. L. Wang

Appl. Phys. Lett. 75, 2677 (1999); http://dx.doi.org/10.1063/1.125116 (3 pages) | Cited 9 times

Full Text: Read Online (HTML) | Download PDF

Show Abstract

A focused Ga-ion beam is used to conduct lithography on a diamond (100) surface with the assistance of various gases (Cl₂, O₂, and XeF₂). The beam-induced dilation and sputtering of the surface are measured by atomic force microscope. The dilation is found to be insensitive to the presence of assisting gases at low doses, while the sputtering is enhanced by O₂ and XeF₂ at high doses. The topographic evolution as a function of the ion dose is well described by a proposed semiempirical equation. Combining physical sputtering and XeF₂-assisted etching, the lithographic process has been used to fabricate submicron structures on diamond surfaces. © 1999 American Institute of Physics.

Show PACS

81.05.ub	Fullerenes and related materials
81.65.Cf	Surface cleaning, etching, patterning
85.40.Hp	Lithography, masks and pattern transfer
68.35.B-	Structure of clean surfaces (and surface reconstruction)

Select this Article

Electron emission from films of carbon nanotubes and ta-C coated nanotubes

S. Dimitrijevic, J. C. Withers, V. P. Mammana, O. R. Monteiro, J. W. Ager, and I. G. Brown

Appl. Phys. Lett. 75, 2680 (1999); http://dx.doi.org/10.1063/1.125122 (3 pages) | Cited 32 times

Full Text: Read Online (HTML) | Download PDF

Show Abstract

The field emission properties of multiwall carbon nanotube films with and without a coating of tetrahedrally bonded amorphous carbon (ta-C) were investigated. Voltage thresholds of 2.4 V/μm for uncoated films and 1.5 V/μm for ta-C coated films were found. The results for the uncoated films are in good agreement with previous measurements of field emission from carbon nanotubes. The effect of the ta-C coating on the emission properties is discussed in light of current field emission models. © 1999 American Institute of Physics.

Show PACS

79.70.+q

Field emission, ionization, evaporation, and desorption

Select this Article

Mechanism for acoustic leakage in surface-acoustic wave resonators on rotated Y-cut lithium tantalate substrate

J. Koskela, J. V. Knuuttila, P. T. Tikka, C. S. Hartmann, V. P. Plessky, and M. M. Salomaa

Appl. Phys. Lett. 75, 2683 (1999); http://dx.doi.org/10.1063/1.125117 (3 pages) | Cited 5 times

Full Text: Read Online (HTML) | Download PDF

Show Abstract

We discuss an acoustic loss mechanism in surface-acoustic wave resonators on 36° YX-cut lithium tantalate substrate. Recent acoustic field scans performed with an optical Michelson interferometer reveal a spatially asymmetric acoustic field atop the busbars of a resonator, giving rise to acoustic beams which escape the resonator area and lead to undesired losses. Here, we link the phenomenon with the inherent crystalline anisotropy of the substrate: the shape of the slowness curves and the asymmetry of the polarization for leaky surface-acoustic waves, propagating at an angle with respect to the crystal X-axis. © 1999 American Institute of Physics.

Show PACS

43.58.Kr	Spectrum and frequency analyzers and filters; acoustical and electrical oscillographs; photoacoustic spectrometers; acoustical delay lines and resonators
85.50.-n	Dielectric, ferroelectric, and piezoelectric devices

Select this Article

Single-event keV proton detection using a delta-doped charge-coupled device

Shouleh Nikzad, Donald Croley, S. Tom Elliott, Thomas J. Cunningham, W. K. Proniewicz, G. B. Murphy, and Todd J. Jones

Appl. Phys. Lett. 75, 2686 (1999); http://dx.doi.org/10.1063/1.125118 (3 pages) | Cited 5 times

Full Text: Read Online (HTML) | Download PDF

Show Abstract

Using a delta-doped charge-coupled device (CCD), we have demonstrated an order-of-magnitude improvement in the low-energy cutoff for particle detection compared to conventional solid-state detectors. Individual protons with energies in the 1.2–12 keV range were successfully detected using a delta-doped, back-illuminated CCD. Moreover, it is shown that, by measuring the charge generated by the proton, it is potentially possible to use delta-doped CCDs to determine the energy of the incoming particle. © 1999 American Institute of Physics.

Show PACS

29.40.Wk	Solid-state detectors
85.30.Tv	Field effect devices

Select this Article

Fountain pen nanochemistry: Atomic force control of chrome etching

Aaron Lewis, Yuri Kheifetz, Efim Shambrodt, Anna Radko, Edward Khatchatryan, and Chaim Sukenik

Appl. Phys. Lett. 75, 2689 (1999); http://dx.doi.org/10.1063/1.125120 (3 pages) | Cited 28 times

Full Text: Read Online (HTML) | Download PDF

Show Abstract

In this report we demonstrate a general method for affecting chemical reactions with a high degree of spatial control that has potentially wide applicability in science and technology. Our technique is based on complexing the delivery of liquid or gaseous materials through a cantilevered micropipette with an atomic force microscope that is totally integrated into a conventional optical microscope. Controlled etching of chrome is demonstrated without detectable effects on the underlying glass substrate. This simple combination allows for the nanometric spatial control of the whole world of chemical reactions in defined regions of surfaces. Applications of the technique in critical areas such as mask repair are likely. © 1999 American Institute of Physics.

Show PACS

07.10.Cm	Micromechanical devices and systems
81.65.Cf	Surface cleaning, etching, patterning
07.79.Lh	Atomic force microscopes
82.65.+r	Surface and interface chemistry; heterogeneous catalysis at surfaces
07.05.Dz	Control systems
07.79.Fc	Near-field scanning optical microscopes
07.10.Pz	Instruments for strain, force, and torque

ERRATA

Select this Article FREE

Erratum: “A (2 math ×2 math surface phase in the 6H–SiC(0001) surface studied by scanning tunneling microscopy” [Appl. Phys. Lett. 75, 650 (1999)]

M. Naitoh, J. Takami, S. Nishigaki, and N. Toyama

Appl. Phys. Lett. 75, 2692 (1999); http://dx.doi.org/10.1063/1.125119 (1 page)

Full Text: Read Online (HTML) | Download PDF

Abstract Unavailable

Show PACS

68.35.B-	Structure of clean surfaces (and surface reconstruction)
61.72.Cc	Kinetics of defect formation and annealing
61.05.jh	Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED)
68.37.Ef	Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps	Atomic force microscopy (AFM)
68.37.Rt	Magnetic force microscopy (MFM)
68.37.Uv	Near-field scanning microscopy and spectroscopy
68.03.Fg	Evaporation and condensation of liquids
68.43.Mn	Adsorption kinetics
99.10.Cd	Errata

SECTION LISTING

BROWSE VOLUMES

25 Oct 1999

Volume 75, Issue 17, pp. 2521-2692

Find articles by AUTHORNAME