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25 Oct 1999

Volume 75, Issue 17, pp. 2521-2692

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Erratum: “A (2math×2math surface phase in the 6H–SiC(0001) surface studied by scanning tunneling microscopy” [Appl. Phys. Lett. 75, 650 (1999)]

M. Naitoh, J. Takami, S. Nishigaki, and N. Toyama

Appl. Phys. Lett. 75, 2692 (1999); http://dx.doi.org/10.1063/1.125119 (1 page)

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Abstract Unavailable
Show PACS
68.35.B- Structure of clean surfaces (and surface reconstruction)
61.72.Cc Kinetics of defect formation and annealing
61.05.jh Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED)
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
68.03.Fg Evaporation and condensation of liquids
68.43.Mn Adsorption kinetics
99.10.Cd Errata
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