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Applied Physics Letters / Volume 76 / Issue 10 / DEVICE PHYSICS

Appl. Phys. Lett. 76, 1333 (2000); http://dx.doi.org/10.1063/1.126025 (3 pages)

Molecular detection based on conductance quantization of nanowires

C. Z. Li, H. X. He, A. Bogozi, J. S. Bunch, and N. J. Tao

Department of Physics, Florida International University, Miami, Florida 33199

(Received 11 November 1999; accepted 7 January 2000)

We have studied molecular adsorption onto stable metallic nanowires fabricated with an electrochemical method. Upon the adsorption, the quantized conductance decreases, typically, to a fractional value, which may be attributed to the scattering of the conduction electrons by the adsorbates. The further conductance change occurs when the nanowire is exposed to another molecule that has stronger adsorption strength. Because the quantized conductance is determined by a few atoms at the narrowest portion of each nanowire, adsorption of a molecule onto the portion is enough to change the conductance, which may be used for chemical sensors. © 2000 American Institute of Physics.

© 2000 American Institute of Physics

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KEYWORDS and PACS

Keywords

metals, quantum wires, nanostructured materials, adsorption, chemical sensors, surface scattering, quantum interference phenomena, electrochemistry

PACS

  • 07.07.Df

    Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

  • 73.61.At

    Metal and metallic alloys

  • 68.03.Fg

    Evaporation and condensation of liquids

  • 68.43.Mn

    Adsorption kinetics

  • 68.43.-h

    Chemisorption/physisorption: adsorbates on surfaces

  • 73.25.+i

    Surface conductivity and carrier phenomena

  • 73.23.-b

    Electronic transport in mesoscopic systems

  • 82.45.-h

    Electrochemistry and electrophoresis

  • 72.15.Qm

    Scattering mechanisms and Kondo effect

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.126025

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    C. Z. Li and N. J. Tao, Appl. Phys. Lett. 72, 894 (1998)APPLAB000072000008000894000001.

    A. F. Morpurgo, C. M. Marcus, and D. B. Robinson, Appl. Phys. Lett. 14, 2084 (1999)APPLAB000074000014002084000001.

    L. Olesen, E. Lægsgaard, I. Stensgaad, F. Besenbacher, J. Schiotz, P. Stoltze, K. W. Jacobsen, and J. K. Norskov, Phys. Rev. Lett. 72, 2251 (1994).

    C. Z. Li, H. Sha, and N. J. Tao, Phys. Rev. B 58, 6775 (1998).

    K. Kankaala, T. Alanissila, and S. C. Ying, Phys. Rev. B 47, 2333 (1993).

    T. Thundat, E. A. Wachter, and S. L. Sharp, Appl. Phys. Lett. 66, 1695 (1995)APPLAB000066000013001695000001;, P. I. Oden, P. G. Datskos, and T. Thundat, 69, 3277 (1996)APPLAB000069000021003277000001.


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