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6 Mar 2000

Volume 76, Issue 10, pp. 1219-1345

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Fine crystal lattice fringes observed using a transmission electron microscope with 1 MeV coherent electron waves

T. Kawasaki, T. Yoshida, T. Matsuda, N. Osakabe, A. Tonomura, I. Matsui, and K. Kitazawa

Appl. Phys. Lett. 76, 1342 (2000); http://dx.doi.org/10.1063/1.126028 (3 pages) | Cited 25 times

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A transmission electron microscope with a 1 MeV cold field-emission electron source has been developed for coherent and penetrating electron waves. We confirmed the coherence and overall stability of the microscope by observing Au(33math) lattice fringes. These fringes have a 0.498 Å spacing. © 2000 American Institute of Physics.
Show PACS
07.78.+s Electron, positron, and ion microscopes; electron diffractometers
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)
68.37.Lp Transmission electron microscopy (TEM)
61.66.Bi Elemental solids
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