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8 May 2000

Volume 76, Issue 19, pp. 2647-2800

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Erratum: “Direct determination of the Andreev reflection probability by means of point contact spectroscopy” [Appl. Phys. Lett. 76, 1152 (2000)]

M. Jakob, H. Stahl, J. Knoch, J. Appenzeller, B. Lengeler, H. Hardtdegen, and H. Lüth

Appl. Phys. Lett. 76, 2800 (2000); http://dx.doi.org/10.1063/1.126479 (1 page)

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73.23.Ad	Ballistic transport
74.45.+c	Proximity effects; Andreev reflection; SN and SNS junctions
73.21.-b	Electron states and collective excitations in multilayers, quantum wells, mesoscopic, and nanoscale systems
73.61.Ey	III-V semiconductors
99.10.Cd	Errata

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