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5 Jun 2000

Volume 76, Issue 23, pp. 3337-3483

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Dependencies of secondary electron yields on work function for metals by electron and ion bombardment

M. Kudo, Y. Sakai, and T. Ichinokawa

Appl. Phys. Lett. 76, 3475 (2000); http://dx.doi.org/10.1063/1.126682 (3 pages) | Cited 10 times

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Secondary electron yields depending on work function were measured for 30 species of metal in ultrahigh vacuum by electron and ion bombardment. Secondary electron yields induced by electrons at 10 keV increase with work function, while those by Ar+ ions at 3 keV decrease with increasing work function. The opposite dependencies of secondary electron yields on work function between electron and ion bombardment are discussed on the basis of the different mechanisms of secondary electron emission, i.e., kinetic and potential emission for electron and ion bombardment, respectively. © 2000 American Institute of Physics.
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73.30.+y Surface double layers, Schottky barriers, and work functions
79.20.Hx Electron impact: secondary emission
79.20.Rf Atomic, molecular, and ion beam impact and interactions with surfaces

Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip–sample interaction

R. Hillenbrand, M. Stark, and R. Guckenberger

Appl. Phys. Lett. 76, 3478 (2000); http://dx.doi.org/10.1063/1.126683 (3 pages) | Cited 45 times

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We present an experimental analysis of the nonlinear tip–sample interaction in tapping-mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever motion. Two aspects of a concept aiming at a full reconstruction of the tip–sample interaction are demonstrated: higher flexural eigenmode vibrations excited by the impact of the oscillating tip on the sample are used to measure the tip–sample interaction time; by imaging at higher harmonics of the driving frequency material contrast is obtained. © 2000 American Institute of Physics.
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68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
07.79.Lh Atomic force microscopes

Acoustic stop-bands in periodically microtapered optical fibers

A. Diez, G. Kakarantzas, T. A. Birks, and P. St. J. Russell

Appl. Phys. Lett. 76, 3481 (2000); http://dx.doi.org/10.1063/1.126684 (3 pages) | Cited 15 times

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A one-dimensional grating microstructure was fabricated on a tapered optical fiber and its acoustic properties experimentally studied. The structure consisted of a number of concatenated and equally spaced microtapers, fabricated using a focused CO2 laser. Acoustic characterization of the device showed a strong frequency stop-band for flexural waves. Such structures are suitable as frequency-selective acoustic mirrors in acousto-optic fiber devices. © 2000 American Institute of Physics.
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42.79.Jq Acousto-optical devices
42.79.Dj Gratings
42.81.Bm Fabrication, cladding, and splicing
42.81.Wg Other fiber-optical devices
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