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26 Jun 2000

Volume 76, Issue 26, pp. 3849-4013

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Self-assembled growth of epitaxial erbium disilicide nanowires on silicon (001)

Yong Chen, Douglas A. A. Ohlberg, Gilberto Medeiros-Ribeiro, Y. Austin Chang, and R. Stanley Williams

Appl. Phys. Lett. 76, 4004 (2000); http://dx.doi.org/10.1063/1.126848 (3 pages) | Cited 136 times

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By choosing a material that has an appropriate asymmetric lattice mismatch to the host substrate, in this case ErSi2 on Si(001), it is possible to grow one-dimensional epitaxial crystals. ErSi2 nanowires are less than one nanometer high, a few nanometers wide, close to a micron long, crystallographically aligned to 〈110〉Si directions, straight, and atomically regular. © 2000 American Institute of Physics.
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68.65.-k Low-dimensional, mesoscopic, nanoscale and other related systems: structure and nonelectronic properties
81.07.-b Nanoscale materials and structures: fabrication and characterization
81.16.-c Methods of micro- and nanofabrication and processing
85.35.-p Nanoelectronic devices
81.05.Hd Other semiconductors
81.05.Cy Elemental semiconductors
68.55.-a Thin film structure and morphology
61.46.-w Structure of nanoscale materials
85.35.Be Quantum well devices (quantum dots, quantum wires, etc.)

Work functions and valence band states of pristine and Cs-intercalated single-walled carbon nanotube bundles

Satoru Suzuki, Chris Bower, Yoshio Watanabe, and Otto Zhou

Appl. Phys. Lett. 76, 4007 (2000); http://dx.doi.org/10.1063/1.126849 (3 pages) | Cited 164 times

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The electronic structures and the work functions of pristine and Cs-intercalated single-walled carbon nanotube bundles were investigated using ultraviolet photoemission spectroscopy. The valence bands of the pristine bundles were considerably altered from those of graphite. A spectral shift to the higher binding energy side was observed in the Cs-intercalated sample. The work function of the pristine bundles was found to be 4.8 eV, which is 0.1–0.2 eV larger than that of graphite. A drastic decrease of the work function to about 2.4 eV was observed in the Cs-intercalated sample. © 2000 American Institute of Physics.
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71.20.Tx Fullerenes and related materials; intercalation compounds
81.05.ub Fullerenes and related materials
73.30.+y Surface double layers, Schottky barriers, and work functions
79.60.-i Photoemission and photoelectron spectra
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