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31 Jan 2000

Volume 76, Issue 5, pp. 523-656

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ERRATA

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Erratum: “Quantitative microwave evanescent microscopy” [Appl. Phys. Lett. 75, 3005 (1999)]

Chen Gao, Fred Duewer, and X.-D. Xiang

Appl. Phys. Lett. 76, 656 (2000); http://dx.doi.org/10.1063/1.125850 (1 page) | Cited 2 times

Full Text: Read Online (HTML) | Download PDF

Abstract Unavailable

Show PACS

84.37.+q	Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)
07.57.-c	Infrared, submillimeter wave, microwave and radiowave instruments and equipment
07.79.-v	Scanning probe microscopes and components
99.10.Cd	Errata

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