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31 Jan 2000

Volume 76, Issue 5, pp. 523-656

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Multiple gratings simultaneously formed in holographic polymer-dispersed liquid-crystal displays

Chris C. Bowley, Adam K. Fontecchio, Gregory P. Crawford, Jau-Jeng Lin, Le Li, and Sadeg Faris

Appl. Phys. Lett. 76, 523 (2000); http://dx.doi.org/10.1063/1.125836 (3 pages) | Cited 32 times

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We report single-layer holographic polymer-dispersed liquid-crystal materials with multiple reflection and/or diffraction gratings. Three switchable gratings are observed in a single film formed in a three-beam interference pattern. Two reflection gratings and one transmission grating are formed, corresponding to each of the three possible two-beam interference fringes. We present scanning electron microscopy and electro-optic results which are in good agreement with our model based on matrix methods and coupled-wave theory. © 2000 American Institute of Physics.
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42.79.Wc Optical coatings
42.40.Eq Holographic optical elements; holographic gratings
42.79.Kr Display devices, liquid-crystal devices
78.20.Jq Electro-optical effects
42.65.Jx Beam trapping, self-focusing and defocusing; self-phase modulation

Near-field spectroscopy of selectively oxidized vertical cavity surface emitting lasers

J. Kim, J. T. Boyd, Howard E. Jackson, and K. D. Choquette

Appl. Phys. Lett. 76, 526 (2000); http://dx.doi.org/10.1063/1.125807 (3 pages) | Cited 9 times

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Selectively oxidized vertical cavity surface emitting lasers (VCSELs) have been studied by spectrally resolved near-field scanning optical microscopy. We have obtained spatially and spectrally resolved images of both subthreshold emission and lasing emission from a selectively oxidized VCSEL operating at a wavelength of 850 nm. Below threshold, highly local high gain regions, emitting local intensity maxima within the active area, were observed; these were found to serve as lasing centers just above threshold. Above threshold, the near-field spatial modal distributions of low order transverse modes were identified by spectrally analyzing the emission; these were found to be complex and somewhat different from those measured in the far field. © 2000 American Institute of Physics.
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42.55.Px Semiconductor lasers; laser diodes
42.60.Da Resonators, cavities, amplifiers, arrays, and rings
07.79.Fc Near-field scanning optical microscopes
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy

Improved characteristics of InGaN multiple-quantum-well laser diodes grown on laterally epitaxially overgrown GaN on sapphire

M. Hansen, P. Fini, L. Zhao, A. C. Abare, L. A. Coldren, J. S. Speck, and S. P. DenBaars

Appl. Phys. Lett. 76, 529 (2000); http://dx.doi.org/10.1063/1.125808 (3 pages) | Cited 37 times

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InGaN multiple-quantum-well laser diodes have been fabricated on fully coalesced laterally epitaxially overgrown (LEO) GaN on sapphire. The laterally overgrown “wing” regions as well as the coalescence fronts contained few or no threading dislocations. Laser diodes fabricated on these low-dislocation-density regions showed a reduction in threshold current density from 10 to 4.8 kA/cm2 compared to those on conventional planar GaN on sapphire. The internal quantum efficiency also improved from 3% for laser diodes on conventional GaN on sapphire to 22% for laser diodes on LEO GaN on sapphire. © 2000 American Institute of Physics.
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81.05.Ea III-V semiconductors
42.55.Px Semiconductor lasers; laser diodes
42.60.By Design of specific laser systems
81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
61.72.Ff Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)

Radiation losses of waveguide-based two-dimensional photonic crystals: Positive role of the substrate

H. Benisty, D. Labilloy, C. Weisbuch, C. J. M. Smith, T. F. Krauss, D. Cassagne, A. Béraud, and C. Jouanin

Appl. Phys. Lett. 76, 532 (2000); http://dx.doi.org/10.1063/1.125809 (3 pages) | Cited 106 times

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Radiation losses occurring in photonic crystals etched into planar waveguides are analyzed using a first-order perturbation approximation. Assuming the incoherent scattering limit, the model indicates that losses diminish as the cladding index approaches the core index. A simple scheme is devised to include these losses into purely two-dimensional calculations by using an imaginary index. Such calculations are shown to agree with corresponding experimental transmission through near-infrared photonic crystals, reproducing the contrasting behavior of the “dielectric” and “air” band edges. © 2000 American Institute of Physics.
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42.70.Qs Photonic bandgap materials
42.79.Gn Optical waveguides and couplers
42.82.Et Waveguides, couplers, and arrays

Stability of the single-mode output of a laser diode array with phase conjugate feedback

S. Juul Jensen, M. Løbel, and P. M. Petersen

Appl. Phys. Lett. 76, 535 (2000); http://dx.doi.org/10.1063/1.125810 (3 pages) | Cited 5 times

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The stability of the output of a single-mode laser diode array with frequency selective phase conjugate feedback has been investigated experimentally. Both the long-term stability of the laser output and the sensitivity to feedback generated by external reflection of the output beam are examined. The output power and the center wavelength are found to be extremely stable in a 100 h stability measurement. External feedback of the output beam into the laser is seen to decrease both the spatial and the temporal coherence of the output significantly. We outline an approach to obtain a stable single-mode output when external feedback is present using spatial filtering in the path of the output beam. © 2000 American Institute of Physics.
Show PACS
42.60.Da Resonators, cavities, amplifiers, arrays, and rings
42.55.Px Semiconductor lasers; laser diodes
42.65.Jx Beam trapping, self-focusing and defocusing; self-phase modulation
42.79.Ci Filters, zone plates, and polarizers

Large enhancement of second harmonic generation in polymer films by microcavities

H. Cao, D. B. Hall, J. M. Torkelson, and C.-Q. Cao

Appl. Phys. Lett. 76, 538 (2000); http://dx.doi.org/10.1063/1.125811 (3 pages) | Cited 22 times

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We report significant enhancement of second-harmonic-generation intensity in a nonlinear optical polymer by strongly confining the fundamental light in a planar microcavity. Employing a microcavity formed by a distributed Bragg reflector and a silver layer, we have observed up to a factor of 50 increase of second-harmonic light intensity in polymer thin films. © 2000 American Institute of Physics.
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42.70.Nq Other nonlinear optical materials; photorefractive and semiconductor materials
42.70.Jk Polymers and organics
42.65.Ky Frequency conversion; harmonic generation, including higher-order harmonic generation
42.65.An Optical susceptibility, hyperpolarizability
78.66.Qn Polymers; organic compounds
42.79.Bh Lenses, prisms and mirrors

Direct measurement of optical phase in the near field

P. L. Phillips, J. C. Knight, J. M. Pottage, G. Kakarantzas, and P. St. J. Russell

Appl. Phys. Lett. 76, 541 (2000); http://dx.doi.org/10.1063/1.125812 (3 pages) | Cited 15 times

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To fully characterize photonic crystal guided wave optical devices, one needs to measure the spatial variation of both the phase and amplitude of the electromagnetic field. In this work, we simultaneously measure the intensity and phase in the near field of both propagating and evanescent fields by incorporating a scanning near-field optical microscope into one arm of a Mach–Zehnder interferometer. We demonstrate the technique by imaging the phase fronts of an evanescent wave formed by total internal reflection and by measuring the phase variation in the LP11 mode in an overmoded optical fiber. © 2000 American Institute of Physics.
Show PACS
42.70.Qs Photonic bandgap materials
07.79.Fc Near-field scanning optical microscopes
07.60.Ly Interferometers
42.50.-p Quantum optics
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
42.81.Cn Fiber testing and measurement of fiber parameters
42.87.-d Optical testing techniques
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