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28 Feb 2000

Volume 76, Issue 9, pp. 1083-1210

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Nanostructure fabrication using pulsed lasers in combination with a scanning tunneling microscope: Mechanism investigation

Y. F. Lu, Z. H. Mai, Y. W. Zheng, and W. D. Song

Appl. Phys. Lett. 76, 1200 (2000); http://dx.doi.org/10.1063/1.125982 (3 pages) | Cited 18 times

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Nanostructure fabrication using lasers in combination with a scanning tunneling microscope has been reported in the past several years. Different mechanisms have been discussed for the formation of these nanostructures. However, they are controversial. In this study, we investigated the mechanism of nanostructure fabrication on both gold films and hydrogen-passivated Ge surfaces. Current-distance curves for a gold film and for an H-passivated Ge surface under an electrochemically etched tungsten tip were measured to determine the tip-sample distance. An analytical model was proposed to explain different mechanisms for nanostructure fabrication on gold films and on H-passivated Ge surfaces. Thermal expansion of the tip under laser irradiation was calculated. With comparison between the tip-sample distance and the thermal expansion of the tip, we can determine whether the mechanism is based on optical enhancement or on thermal mechanical indentation. © 2000 American Institute of Physics.
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81.07.-b Nanoscale materials and structures: fabrication and characterization
81.16.-c Methods of micro- and nanofabrication and processing
85.35.-p Nanoelectronic devices
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
81.65.Rv Passivation
68.35.Gy Mechanical properties; surface strains
42.62.-b Laser applications
81.05.Cy Elemental semiconductors
65.40.De Thermal expansion; thermomechanical effects

Extracting interaction forces and complementary observables in dynamic probe microscopy

U. Dürig

Appl. Phys. Lett. 76, 1203 (2000); http://dx.doi.org/10.1063/1.125983 (3 pages) | Cited 45 times

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We address the problem of interaction sensing in dynamic probe microscopy. An iterative method is presented for extracting the laws of interaction from dynamically measured observables. The method exploits the fact that in the limit of negligible anharmonicity of the tip motion, the observables are related to corresponding force laws via linear convolution operators involving weakly divergent kernels, which represent weighted monopole or dipole moments of the interaction probed by the tip. © 2000 American Institute of Physics.
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07.79.-v Scanning probe microscopes and components
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
07.10.Pz Instruments for strain, force, and torque

High-contrast topography-free sample for near-field optical microscopy

T. Kalkbrenner, M. Graf, C. Durkan, J. Mlynek, and V. Sandoghdar

Appl. Phys. Lett. 76, 1206 (2000); http://dx.doi.org/10.1063/1.125984 (3 pages) | Cited 6 times

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The issue of topography artifacts has proven to play a very important role in interpreting images recorded in scanning near-field optical microscopy. We report on the fabrication and characterization of samples with essentially no topographic features while possessing very high optical contrast on the nanometric lateral scale. These samples open the door to routine and uncontroversial examinations of the resolution obtained in a scanning near-field optical microscope. © 2000 American Institute of Physics.
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07.79.Fc Near-field scanning optical microscopes
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
68.35.B- Structure of clean surfaces (and surface reconstruction)
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