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25 Dec 2000

Volume 77, Issue 26, pp. 4247-4436

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Investigating material and functional properties of static random access memories using cantilevered glass multiple-wire force-sensing thermal probes

Rimma Dekhter, Edward Khachatryan, Yuri Kokotov, Aaron Lewis, Sophia Kokotov, Galina Fish, Yefim Shambrot, and Klony Lieberman

Appl. Phys. Lett. 77, 4425 (2000); http://dx.doi.org/10.1063/1.1332103 (3 pages)

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A double-wire cantilevered glass probe has been produced for scanned probe microthermal, resistivity, and topographic measurements. The structure has many potentially unique properties for scanned probe microscopy and other nanotechnological measurements. In this letter, a double Pt wire probe was fused at the tip and applied to thermal resistive measurements. The probe operation is based on the linear dependence of Pt resistance on temperature. Most microscopic structures are composed of a variety of materials. In the present study, the features of a static random access memory chip are investigated. Such memory chips are composed of materials such as dielectrics, metals, and semiconductors. We demonstrate that these samples, which are prepared using a chemical–mechanical polishing procedure and have essentially no surface topography, can be inspected using the thermal conductivity, resistivity, and topographic sensitivity of these probes. © 2000 American Institute of Physics.
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84.30.Sk Pulse and digital circuits
85.40.Qx Microcircuit quality, noise, performance, and failure analysis
07.79.Lh Atomic force microscopes
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
07.20.-n Thermal instruments and apparatus
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
07.10.Pz Instruments for strain, force, and torque

Band gaps and localization in acoustic propagation in water with air cylinders

Zhen Ye and Emile Hoskinson

Appl. Phys. Lett. 77, 4428 (2000); http://dx.doi.org/10.1063/1.1334941 (3 pages) | Cited 18 times

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Multiple scattering of waves leads to many peculiar phenomena such as complete band gaps in periodic structures and wave localization in disordered media. Within a band gap, excitations are evanescent; when localized, they remain confined in space until dissipated. Here, we report acoustic band gap and localization in a two-dimensional system of air cylinders in water. Exact numerical calculations reveal the unexpected result that localization is independent of the precise location or organization of the scatterers. Localization occurs within a finite region of frequencies, coincident with the complete band gap for a periodic lattice of scatterers. Inside the gap or localization regime, a previously uninvestigated collective behavior of the cylinders appears. © 2000 American Institute of Physics.
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43.25.Jh Reflection, refraction, interference, scattering, and diffraction of intense sound waves
62.60.+v Acoustical properties of liquids
43.25.Cb Macrosonic propagation, finite amplitude sound; shock waves
43.30.-k Underwater sound

Synthesis of tailored composite nanoparticles in the gas phase

Arkadi Maisels, F. Einar Kruis, Heinz Fissan, Bernd Rellinghaus, and Horst Zähres

Appl. Phys. Lett. 77, 4431 (2000); http://dx.doi.org/10.1063/1.1335843 (3 pages) | Cited 5 times

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We report on a method to obtain tailored nanoparticle aggregates of two components in the gas phase. The method is based on the modification of the Brownian collision rate by charging the nanoparticles. Particles of different components are charged oppositely in order to obtain composite nanoparticle aggregates via preferential coagulation. The resulting composite aggregates are uncharged, which allows for their separation from both, charged unaggregated particles and charged aggregates of only one component. The mean size and standard deviation of each particle component can be adjusted by means of differential mobility analysis. Experimental results are presented for composites of PbS and Ag. © 2000 American Institute of Physics.
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61.46.-w Structure of nanoscale materials
81.07.-b Nanoscale materials and structures: fabrication and characterization
81.20.-n Methods of materials synthesis and materials processing

Ultrafast scanning tunneling microscopy with 1 nm resolution

N. N. Khusnatdinov, T. J. Nagle, and G. Nunes

Appl. Phys. Lett. 77, 4434 (2000); http://dx.doi.org/10.1063/1.1336817 (3 pages) | Cited 13 times

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We present data demonstrating that junction-mixing scanning tunneling microscopy (JM–STM) can provide simultaneous picosecond time resolution and nanometer spatial resolution. Experiments were performed on an Au surface with a patterned Ti overlayer. Our measurements under ultrahigh vacuum conditions achieve a spatial resolution of 1 nm using the tunneling currents generated by 20 ps voltage transients. The observed contrast in a JM–STM signal is demonstrated to arise entirely from the difference in electronic structure between the Au and Ti surfaces. These results confirm that JM–STM signals originate in the tunnel junction and maintain the atomic-scale spatial resolution inherent in STM. © 2000 American Institute of Physics.
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68.35.B- Structure of clean surfaces (and surface reconstruction)
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
07.79.Cz Scanning tunneling microscopes
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