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2 Apr 2001

Volume 78, Issue 14, pp. 1961-2084

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Resonance frequency shifts caused by the friction of a drop of water in air: An approach to estimate shear forces in scanning probe microscopies

A.-D. Müller and F. Müller

Appl. Phys. Lett. 78, 2079 (2001); http://dx.doi.org/10.1063/1.1361101 (3 pages) | Cited 1 time

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In scanning near-field optical microscopy, scanning ion conductance microscopy and for localized electrochemical deposition out of micropipettes, the detection of shear forces between the tip and sample is one of the most common methods of distance control. Here, pulled micropipettes were utilized to form an evaporating drop of water whose frictional force in air causes a specific resonance shift of the tip vibration. This resonance shift and the amplitude at the resonance were investigated with regard to their dependence on the drop diameter. In order to calculate the friction, the tip is approximated as a damped harmonic oscillator. The typical range of the shear forces in scanning probe microscopies is estimated to be between 1 pN and 0.1 nN. © 2001 American Institute of Physics.
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07.79.Sp Friction force microscopes
68.03.Fg Evaporation and condensation of liquids
68.37.Uv Near-field scanning microscopy and spectroscopy
64.70.F- Liquid-vapor transitions

Differential interference contrast x-ray microscopy with submicron resolution

Thomas Wilhein, Burkhard Kaulich, Enzo Di Fabrizio, Fillipo Romanato, Stefano Cabrini, and Jean Susini

Appl. Phys. Lett. 78, 2082 (2001); http://dx.doi.org/10.1063/1.1360776 (3 pages) | Cited 30 times

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Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy. © 2001 American Institute of Physics.
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07.85.Tt X-ray microscopes
41.50.+h X-ray beams and x-ray optics
42.79.Ci Filters, zone plates, and polarizers
07.05.Pj Image processing
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