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Appl. Phys. Lett. 78, 2922 (2001); http://dx.doi.org/10.1063/1.1370984 (3 pages)
Epitaxial growth of (103)-oriented ferroelectric SrBi2Ta2O9 thin films on Si(100)
(Received 10 October 2000; accepted 12 March 2001)
1]∥MgO[0
1]∥YSZ〈001〉∥Si〈001〉. The ferroelectric measurements of the (103)-oriented SBT films showed a remanent polarization (Pr) of 5.2 μC/cm2 and a coercive field (Ec) of 76 kV/cm for a maximum applied electric field of 440 kV/cm. © 2001 American Institute of Physics. © 2001 American Institute of Physics
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Keywords
strontium compounds, bismuth compounds, ferroelectric materials, ferroelectric thin films, pulsed laser deposition, vapour phase epitaxial growth, X-ray diffraction
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