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24 Sep 2001

Volume 79, Issue 13, pp. 1933-2115

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Tailoring of self-assembled monolayer for polymer light-emitting diodes

Beomrak Choi, Jungsoo Rhee, and Hong H. Lee

Appl. Phys. Lett. 79, 2109 (2001); http://dx.doi.org/10.1063/1.1398327 (3 pages) | Cited 31 times

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The choice of a self-assembled monolayer (SAM) is tailored to specifically remove water on an indium-tin oxide electrode and to reduce barrier height for long-term stability of polymer light-emitting diodes. Water, which is a major cause of long-term degradation, is shown to have entirely reversible effects on the power efficiency of the device. It is shown that the use of a SAM for the specific purposes results in a more than an order of magnitude increase in the half lifetime of the device based on poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene]. © 2001 American Institute of Physics.
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85.60.Jb Light-emitting devices
85.60.Bt Optoelectronic device characterization, design, and modeling
78.66.Qn Polymers; organic compounds
68.47.Pe Langmuir-Blodgett films on solids; polymers on surfaces; biological molecules on surfaces
78.60.Fi Electroluminescence

X-ray phase retrieval in high-resolution refraction data from amorphous materials

K. Siu, A. Y. Nikulin, K. Tamasaku, and T. Ishikawa

Appl. Phys. Lett. 79, 2112 (2001); http://dx.doi.org/10.1063/1.1407297 (3 pages) | Cited 4 times

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A recently developed experimental–analytical x-ray diffraction method for the direct, nondestructive characterization of crystalline materials is applied to analyze high-resolution x-ray refraction data from amorphous materials. The method uses a logarithmic dispersion relation to determine the x-ray phase. A priori knowledge of the sample structure is utilized to reconstruct the physical characteristics of the sample with a resolution of 0.25 μm. © 2001 American Institute of Physics.
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61.05.cc Theories of x-ray diffraction and scattering
61.43.-j Disordered solids
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