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23 Jul 2001

Volume 79, Issue 4, pp. 449-553

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Quantitative surface stress measurements using a microcantilever

Michel Godin, Vincent Tabard-Cossa, Peter Grütter, and Peter Williams

Appl. Phys. Lett. 79, 551 (2001); http://dx.doi.org/10.1063/1.1387262 (3 pages) | Cited 36 times

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A method for calculating the surface stress associated with the deflection of a micromechanical cantilever is presented. This method overcomes some of the limitations associated with Stoney’s formula by circumventing the need to know the cantilever’s Young’s modulus, which can have a high level of uncertainty, especially for silicon nitride cantilevers. The surface stress is calculated using readily measurable cantilever properties, such as its geometry, spring constant, and deflection. The method is applicable to both rectangular and triangular cantilevers. A calibration of the deflection measurement is also presented. The surface stress measurement is accurate to within 4%–7%. © 2001 American Institute of Physics.
Show PACS
07.10.Cm Micromechanical devices and systems
07.79.Lh Atomic force microscopes
46.80.+j Measurement methods and techniques in continuum mechanics of solids
07.10.Pz Instruments for strain, force, and torque
06.20.F- Units and standards
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
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