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6 Aug 2001

Volume 79, Issue 6, pp. 705-888

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Comment on “High-resolution electron microscopy investigations on stacking faults in SrBi₂Ta₂O₉ ferroelectric thin films” [Appl. Phys. Lett. 78, 973 (2001)]

M. A. Zurbuchen, D. G. Schlom, and S. K. Streiffer

Appl. Phys. Lett. 79, 887 (2001); http://dx.doi.org/10.1063/1.1390315 (2 pages) | Cited 4 times

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61.72.Nn	Stacking faults and other planar or extended defects
68.55.Ln	Defects and impurities: doping, implantation, distribution, concentration, etc.
68.37.Lp	Transmission electron microscopy (TEM)
77.55.-g	Dielectric thin films
77.84.Ek	Niobates and tantalates
77.84.Cg	PZT ceramics and other titanates

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6 Aug 2001

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