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6 Aug 2001

Volume 79, Issue 6, pp. 705-888

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Compact all-solid-state source of polarization-entangled photon pairs

Jürgen Volz, Christian Kurtsiefer, and Harald Weinfurter

Appl. Phys. Lett. 79, 869 (2001); http://dx.doi.org/10.1063/1.1389835 (3 pages)

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A compact source of polarization-entangled photon pairs at a wavelength of 856 nm is realized using a frequency-doubled laser diode as the pump source for cavity-enhanced type-II spontaneous parametric down-conversion. Our setup generates photon pairs with entanglement visibility of ⩾95% and with count rates comparable to those of standard experiments based on large-frame ion lasers. © 2001 American Institute of Physics.
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42.65.Ky Frequency conversion; harmonic generation, including higher-order harmonic generation
42.50.-p Quantum optics
03.67.Hk Quantum communication

Self-assembly of colloidal spheres on patterned substrates

Y.-H. Ye, S. Badilescu, Vo-Van Truong, P. Rochon, and A. Natansohn

Appl. Phys. Lett. 79, 872 (2001); http://dx.doi.org/10.1063/1.1391234 (3 pages) | Cited 51 times

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We report here on the self-assembly of polystyrene colloidal spheres on patterned substrates. The substrate was a grating with a periodic one-dimensional-height profile. The two-dimensional (2D) arrays of colloidal spheres were obtained by the convective self-assembly method. It is shown that these structures strongly depend on the ratio between the diameter of the sphere (d) and the period of the grating (p) (x = d/p). When 1<x<1.15, and 1.15<x<2, the 2D array showed a centered-rectangular symmetry. For x = 1.15 and 2, the ordered 2D array had a hexagonal symmetry structure. The angle between the grating groove direction and the crystal lattice vector (θ) is given by θ = sin−1(d/p). It is suggested that the variety of the 2D structures are formed by the capillary forces and the self-shadowing effects during the drying process. © 2001 American Institute of Physics.
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68.47.Pe Langmuir-Blodgett films on solids; polymers on surfaces; biological molecules on surfaces
82.70.Dd Colloids

Characterization of thin polymer films using terahertz time-domain interferometry

S. Krishnamurthy, M. T. Reiten, S. A. Harmon, and R. A. Cheville

Appl. Phys. Lett. 79, 875 (2001); http://dx.doi.org/10.1063/1.1389823 (3 pages) | Cited 12 times

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An interferometer for broadband single-cycle THz pulses is developed based on the Michelson configuration. Total internal reflection of THz pulses in high-resistivity silicon prisms provides a nearly 180° phase shift of one arm relative to the other to achieve destructive interference. We show that due to automatic compensation for laser fluctuations by the interferometer, it is possible to measure the index and absorption of thin-film samples with more accuracy than is achievable with standard THz time-domain spectroscopy. We demonstrate characterization of the complex index of refraction of 2 μm thick Mylar (polyester) films. By measuring the signal amplitude directly in the time domain, the interferometer can be used for rapid measurements of film thickness with a resolution of better than 1 μm. © 2001 American Institute of Physics.
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61.41.+e Polymers, elastomers, and plastics
68.55.-a Thin film structure and morphology
78.66.Qn Polymers; organic compounds
78.20.Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
78.47.-p Spectroscopy of solid state dynamics

Optical measurement of large transient mechanical displacements

Christophe Barrière and Daniel Royer

Appl. Phys. Lett. 79, 878 (2001); http://dx.doi.org/10.1063/1.1389503 (3 pages) | Cited 4 times

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A simple method suitable for extracting large mechanical displacements from the phase modulation of an optical beam reflected from the moving surface is presented. In the MHz range, transient displacements larger than 1 μm have been measured with a standard heterodyne interferometer. © 2001 American Institute of Physics.
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06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
68.35.Ja Surface and interface dynamics and vibrations
07.60.Ly Interferometers
42.79.Hp Optical processors, correlators, and modulators

Parametric study of single-axis acoustic levitation

W. J. Xie and B. Wei

Appl. Phys. Lett. 79, 881 (2001); http://dx.doi.org/10.1063/1.1391398 (3 pages) | Cited 30 times

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Remarkable enhancement of the single-axis acoustic levitation force is achieved by properly curving the surface and enlarging the section of the reflector so as to levitate high density material like tungsten (ρs = 18.92 g/cm3). A two-cylinder model incorporating the boundary element method simulations is presented for systematic study of the relationship between levitation capabilities and geometric parameters. The model proves to be successful in predicting resonant modes and explaining deviation of the levitated samples near the reflector and driver. The dependence of levitation force on resonant mode, reflector section radius Rb and curvature radius R is revealed and summarized, which agrees with the experiment in principle and suggests that a reflector with large Rb and small R (when Rb/λ ≥ 0.982) working under mode 1 assures better levitation capabilities. © 2001 American Institute of Physics.
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43.25.Uv Acoustic levitation
43.25.Gf Standing waves; resonance
02.60.Lj Ordinary and partial differential equations; boundary value problems

On-the-fly depth profiling during ablation with ultrashort laser pulses: A tool for accurate micromachining and laser surgery

Rune Lausten and Peter Balling

Appl. Phys. Lett. 79, 884 (2001); http://dx.doi.org/10.1063/1.1391404 (3 pages) | Cited 5 times

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A method for accurate depth profiling of a region subjected to ablation with ultrashort laser pulses is demonstrated. Time-gated imaging of the backscattered radiation from the ablation region is performed in a geometry, which allows the depth along a chosen axis on the sample to be determined with a single measurement. The profiling system has a spatial resolution of a few micrometers and applications are promoted by the fact that the measurement is performed with the same pulse that undertakes ablation. This also indicates that the method is inherently suited for in situ on-the-fly measurements. © 2001 American Institute of Physics.
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42.62.Cf Industrial applications
81.20.Wk Machining, milling
87.85.Va Micromachining
42.62.Be Biological and medical applications
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
42.62.Eh Metrological applications; optical frequency synthesizers for precision spectroscopy
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