In most electronic devices, the electric current of both types (electrons and holes) flows through a junction. Usually the boundary conditions have been formulated exclusively for open circuit. The boundary conditions proposed here bypass this limitation. Besides, these boundary conditions correctly describe the current flow in a circuit, i.e., closed circuit conditions, which are the usual operation conditions for electronic devices and for the measurement of many transport properties. We also have generalized the case (as much as it is possible in a classical treatment), so self-consistent boundary conditions that describe the current flow through a contact between two arbitrary conducting media are developed in the present work. These boundary conditions take into account a recently developed theory: influence of temperature space inhomogeneity due to the interfaces and quasiparticles temperature mismatch on thermogeneration and recombination. They also take into account surface resistance, surface recombination rates, and possible temperature discontinuities at the interface due to finite surface thermoconductivity. The temperature difference between current carriers and phonon subsystems is also included in this approach. © 2002 American Institute of Physics.