APL Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App Facebook

BROWSE VOLUMES

Year Range: 
Search Issue | RSS Feeds RSS
Previous Issue Next Issue

17 Jun 2002

Volume 80, Issue 24, pp. 4483-4665

Return to All Sections
back to top
RSS Feeds

Measurement of electronic stopping power of swift heavy ions using high-resolution time-of-flight spectrometer

Y. Zhang, G. Possnert, and W. J. Weber

Appl. Phys. Lett. 80, 4662 (2002); http://dx.doi.org/10.1063/1.1486042 (3 pages) | Cited 8 times

Online Publication Date: 10 June 2002

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Using only time of flight data to determine energy loss, an analysis procedure has been developed to improve the precision of simultaneously measuring electronic stopping powers of swift heavy ions from a continuous energy spectrum provided by a typical elastic recoil detection analysis geometry. This procedure eliminates the well-known calibration problem of Si detectors when used with heavy ions. Consequently, the stopping powers and the energy dependence are determined with higher precision. This approach is demonstrated by measuring the stopping powers of Be, C, Si, and Br in amorphous C over a continuous range of energies. The results exhibit good agreement with limited existing data but indicate some deviations from the predicted theoretical values. © 2002 American Institute of Physics.
Show PACS
07.75.+h Mass spectrometers
61.85.+p Channeling phenomena (blocking, energy loss, etc.)
61.80.Jh Ion radiation effects
61.82.-d Radiation effects on specific materials
Return to All Sections
Close

Google Calendar

ADVERTISEMENT

Go to AIP Home   © AIP Publishing LLC
close