Epitaxially twinned (001)- , (118)- , and (104)-oriented La-substituted Bi4Ti3O12
(BLT) ferroelectric films have been grown by pulsed laser deposition on (001)- , (011)- , and (111)-oriented SrTiO3
single-crystal substrates, respectively, covered with SrRuO3.
Well-defined (001)-oriented BLT films were grown at a substrate temperature as low as 600 °C.
By x-ray diffraction characterization it has been found that the low-index three-dimensional epitaxial orientation relationship BLT(001)‖SrRuO3(001)‖SrTiO3(001); BLT‖SrRuO3‖SrTiO3
is valid for all epitaxially twinned BLT thin films grown on SrRuO3
substrates in spite of their different orientations. The (104)-oriented BLT films showed an about 1.5 times higher remanent polarization (2Pr = 31.9 μC/cm2)
than the (118)-oriented BLT films (2Pr = 20.7 μC/cm2),
while (001)-oriented BLT films revealed only a small polarization component (2Pr = 1.1 μC/cm2),
thus demonstrating the ferroelectric anisotropy. © 2002 American Institute of Physics.