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16 Sep 2002

Volume 81, Issue 12, pp. 2145-2305

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Vibrational mode analysis of β-phase poly(vinylidene fluoride)

J. C. Li, C. L. Wang, W. L. Zhong, P. L. Zhang, Q. H. Wang, and J. F. Webb

Appl. Phys. Lett. 81, 2223 (2002); http://dx.doi.org/10.1063/1.1507356 (3 pages) | Cited 17 times

Online Publication Date: 9 September 2002

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The infrared spectrum of β-phase poly(vinylidene fluoride) (PVDF) film (30 μm) in the region from 4000 to 400 cm−1 has been measured. The vibrational frequencies of all-trans chains of PVDF have been calculated from first principles based on a restricted Hartree–Fock self-consistent field method. The calculated result is in good agreement with the experiment. All the vibrational modes were divided into three types, only one of them which is in the region from 1330 to 1020 cm−1, corresponds to a changing dipole moment, and may be responsible for the spontaneous polarization. © 2002 American Institute of Physics.
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77.84.Jd Polymers; organic compounds
77.55.-g Dielectric thin films
78.30.Jw Organic compounds, polymers
63.20.-e Phonons in crystal lattices
77.22.Ej Polarization and depolarization
77.80.-e Ferroelectricity and antiferroelectricity
78.66.Qn Polymers; organic compounds

Dielectric and ferroelectric anisotropy of intergrowth Bi4Ti3O12–PbBi4Ti4O15 single crystals

Yu Goshima, Yuji Noguchi, and Masaru Miyayama

Appl. Phys. Lett. 81, 2226 (2002); http://dx.doi.org/10.1063/1.1506791 (3 pages) | Cited 22 times

Online Publication Date: 9 September 2002

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Intergrowth Bi4Ti3O12–PbBi4Ti4O15 single crystals were grown, and their dielectric and ferroelectric anisotropy were investigated along the a and c axes. Dielectric measurements revealed that the Curie temperature was 550 °C, which was lower than that of Bi4Ti3O12 (675 °C) and PbBi4Ti4O15 (570 °C). Remanent polarization was observed for intergrowth oxides not only along the a axis but also along the c axis, and the c-axis component is suggested to originate from Bi4Ti3O12 layers in the intergrowth structure. © 2002 American Institute of Physics.
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77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
77.80.B- Phase transitions and Curie point
77.22.Ej Polarization and depolarization
77.80.Dj Domain structure; hysteresis

Approach for enhanced polarization of polycrystalline bismuth titanate films by Nd3+/V5+ cosubstitution

Hiroshi Uchida, Hiroki Yoshikawa, Isao Okada, Hirofumi Matsuda, Takashi Iijima, Takayuki Watanabe, Takashi Kojima, and Hiroshi Funakubo

Appl. Phys. Lett. 81, 2229 (2002); http://dx.doi.org/10.1063/1.1507839 (3 pages) | Cited 73 times

Online Publication Date: 9 September 2002

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Thin films of Nd3+-substituted bismuth titanate, (Bi4.00−y,Ndy)Ti3.00O12 (BNT), Nd3+/V5+-cosubstituted bismuth titanate, (Bi4.00−y,Ndy)(Ti3.00−xVx)O12 (BNTV), and La3+-substituted bismuth titanate, (Bi3.25,La0.75)Ti3.00O12 (BLT) were fabricated on the (111)Pt/Ti/SiO2/(100)Si substrates by a chemical solution deposition technique. These films possessed random-oriented polycrystalline structure. The BNT film had larger remnant polarization (Pr) than the BLT film; Pr and coercive field (Ec) of the BNT film with y = 0.50 were 32 μC/cm2 and 126 kV/cm, respectively. Furthermore, V5+ substitution improved the Pr value of the BNT film up to 37 μC/cm2 (BNTV film; y = 0.50, x = 0.02), while the BNTV film had an Ec value of approximately 119 kV/cm which was similar to that of the BNT film. Ferroelectric properties of the Pb-free polycrystalline BNT and BNTV films are comparable with those of conventional Pb-based ferroelectric films like a lead zirconate titanate. © 2002 American Institute of Physics.
Show PACS
77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
77.55.-g Dielectric thin films
77.22.Ej Polarization and depolarization
77.80.-e Ferroelectricity and antiferroelectricity

Pore size distributions in nanoporous methyl silsesquioxane films as determined by small angle x-ray scattering

E. Huang, M. F. Toney, W. Volksen, D. Mecerreyes, P. Brock, H.-C. Kim, C. J. Hawker, J. L. Hedrick, V. Y. Lee, T. Magbitang, R. D. Miller, and L. B. Lurio

Appl. Phys. Lett. 81, 2232 (2002); http://dx.doi.org/10.1063/1.1507841 (3 pages) | Cited 34 times

Online Publication Date: 9 September 2002

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Small angle x-ray scattering (SAXS) measurements were performed on nanoporous methyl silsesquioxane films that were generated by the incorporation of a sacrificial polymeric component into the matrix and subsequently removed by thermolysis. The average pore radii ranged from 1 to 5 nm over a porosity range of ∼ 5–50%. The distribution in pore size was relatively broad and increases in breadth with porosity. The values and observations obtained by SAXS are in good agreement with field emission scanning electron microscopy. © 2002 American Institute of Physics.
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61.43.Gt Powders, porous materials
61.46.-w Structure of nanoscale materials
68.55.-a Thin film structure and morphology
78.70.Ck X-ray scattering
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